Preparation of sharp polycrystalline tungsten tips for scanning tunneling microscopy imaging

被引：60
作者：
Zhang, R
Ivey, DG
机构：
[1] Dept. Mining, Metall., Petrol. Eng., University of Alberta, Edmonton
来源：
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 01期
关键词：
D O I：
10.1116/1.589029
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The fabrication of scanning tunneling microscopy (STM) tips by de downward electrochemical polishing and ion milling has been investigated. The influence of parameters, such as voltage, immersion depth, cutoff time? and solution concentration, on the shape and sharpness of electropolished W tips are presented. Both electropolished and ion milled tips, which were characterized by transmission electron microscopy !TEM!, were tested on Au films deposited on [100] oriented Si. The effects of tip radius on STM images are discussed thoroughly, and the results are also compared to atomic force microscopy (AFM) and TEM images. (C) 1996 American Vacuum Society.
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页码：1 / 10
页数：10
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