Uni-axial measurement of three-dimensional surface profile by liquid crystal digital shifter

被引:8
作者
Otani, Yukitoshi [1 ]
Kobayashi, Fumio [1 ]
Mizutani, Yasuhiro [2 ,3 ]
Watanabe, Shuugo [4 ]
Harada, Manabu [4 ]
Yoshizawa, Toru
机构
[1] Utsunomiya Univ, Ctr Opt Res & Educ CORE, Utsunomiya, Tochigi 3218585, Japan
[2] Univ Tokushima, Tokushima 7708506, Japan
[3] Saitama Med Univ, Saitama 3501241, Japan
[4] Malcom Co Ltd, Tokyo 1510071, Japan
来源
INTERFEROMETRY XV: TECHNIQUES AND ANALYSIS | 2010年 / 7790卷
关键词
3D surface profile measurement; 3D surface profile measurement with the projection grating; Uni-axis; Digital Sifter; SHAPE;
D O I
10.1117/12.861561
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A uni-axial measurement of three dimensional surface profiles by a liquid crystal digital shifter is proposed using a telecentric optical system. Height information is captured by measuring the contrast in the projected pattern. A shadow less measurement of the object's area is archived by using a uni-axial system. The magnification of the object image captured by a CCD camera is made constant by changing the focus distance. The liquid crystal digital shifter is a powerful tool to make arbitrary intensity and frequency distribution. Surface profiles of mechanical parts were measured to demonstrate this method.
引用
收藏
页数:6
相关论文
共 11 条
[1]   Three-dimensional surface measurement using grating projection method by detecting phase and contrast [J].
Ishihara, M ;
Nakazato, Y ;
Sasaki, H ;
Tonooka, M ;
Yamamoto, M ;
Otani, Y ;
Yoshizawa, T .
OPTICAL ENGINEERING FOR SENSING AND NANOTECHNOLOGY (ICOSN'99), 1999, 3740 :114-117
[2]  
Ishii A., 2000, PATTERN RECOGN, V4, P4828
[3]   Liquid pressure varifocus lens [J].
Kuwano, R ;
Tokunaga, T ;
Otani, Y ;
Umeda, N .
OPTICAL REVIEW, 2005, 12 (05) :405-408
[4]  
Mizutani Y., 2005, P SOC PHOTO-OPT INS, V6000, p6000J
[5]   SHAPE FROM FOCUS [J].
NAYAR, SK ;
NAKAGAWA, Y .
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 1994, 16 (08) :824-831
[6]   Method of obtaining optical sectioning by using structured light in a conventional microscope [J].
Neil, MAA ;
Juskaitis, R ;
Wilson, T .
OPTICS LETTERS, 1997, 22 (24) :1905-1907
[7]   Three-dimensional profilometry based on focus method by projecting LC grating pattern [J].
Otani, Yukitoshi ;
Kobayashi, Fumio ;
Mizutani, Yasuhiro ;
Yoshizawa, Toru .
OPTICAL INSPECTION AND METROLOGY FOR NON-OPTICS INDUSTRIES, 2009, 7432
[8]   Absolute three-dimensional shape measurements using coaxial and coimage plane optical systems and Fourier fringe analysis for focus detection [J].
Takeda, M ;
Aoki, T ;
Miyamoto, Y ;
Tanaka, H ;
Gu, RW ;
Zhang, ZB .
OPTICAL ENGINEERING, 2000, 39 (01) :61-68
[9]   Three dimensional surface profilometry using structured liquid crystal grating [J].
Yamatani, K ;
Fujita, H ;
Yamamoto, M ;
Suguro, A ;
Otani, Y ;
Morokawa, S ;
Yoshizawa, T .
OPTICAL MANUFACTURING AND TESTING III, 1999, 3782 :291-296
[10]   Uni-axis range finder using contrast detection of a projected pattern [J].
Yoshizawa, T ;
Shinoda, T ;
Otani, Y .
OPTOMECHATRONIC SYSTEMS, 2001, 4190 :115-122