The Semiconductor Character of Passive Film of 304L Stainless Steel(SS), 316L SS and Nickel Alloy 800 Formed in Zinc Contained High-temperature and High-pressure Water

被引：0
|
作者：
Zhang, Shenghan [1 ]
Lian, Jia [1 ]
Tan, Yu [1 ]
机构：
[1] N China Elect Power Univ, Environm Sci & Engn Sch, Baoding, Hebei, Peoples R China
来源：
ENVIRONMENTAL BIOTECHNOLOGY AND MATERIALS ENGINEERING, PTS 1-3 | 2011年 / 183-185卷
关键词：
zinc addition; high-temperature and high-pressure water; stainless steel; passive film; semiconductor properties; CORROSION;
D O I：
10.4028/www.scientific.net/AMR.183-185.1847
中图分类号：
Q81 [生物工程学（生物技术）]; Q93 [微生物学];
学科分类号：
071005 ; 0836 ; 090102 ; 100705 ;
摘要：
The semiconductor properties of passive film formed on 304L stainless steel (SS), 316L SS and Alloy 800HT in high-temperature and high-pressure water with zinc addition have been investigated by using Polarization curve, Mott-Schottky analysis and photocurrent method. The donor density, flat band and band gap of semiconductor behavior are analyzed to investigate the impact of zinc addition to the passive film. Analysis of the experimental results indicated that passive film formed on 316L and 800HT with zinc addition showed different electrochemical, photo-electrochemical and semiconductor properties. The results indicated that corrosion resistance of passive film from in high-temperature and high-pressure water with zinc addition was obviously better than that without zinc addition.
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收藏
页码：1847 / 1851
页数：5
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