Growth mechanism of twinned SiC nanowires synthesized by a simple thermal evaporation method

被引:36
作者
Chen, Jianjun [1 ]
Pan, Yi [2 ,3 ]
Wu, Renbing [2 ]
机构
[1] Zhejiang Sci Tech Univ, Ctr Optoelect Mat & Devices, Dept Phys, Hangzhou 310018, Zhejiang, Peoples R China
[2] Zhejiang Univ, Dept Mat Sci & Engn, Hangzhou 310027, Peoples R China
[3] Zhejiang Sci Tech Univ, Minist Educ, Key Lab Adv Text Mat & Mfg Technol, Hangzhou 310018, Zhejiang, Peoples R China
基金
中国国家自然科学基金;
关键词
Silicon carbide; Nanowires; Crystal morphology; Growth mechanism; Chemical vapor deposition; TRANSMISSION ELECTRON-MICROSCOPY; SEMICONDUCTOR NANOWIRES; SILICON-CARBIDE; WHISKERS; CRYSTAL;
D O I
10.1016/j.physe.2010.05.016
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Hexagonal prism shaped beta-SiC nanowires with thinner tips and (1 1 1) twin structure were obtained via a simple evaporation method. The morphology featured by the thinner tip rooted on the top of a SiC nanowire suggests the screw dislocation growth of nanowires. Based on these results, a growth mechanism for the twinned nanowires was proposed. The reaction involving SiO and CO gas and atom rearrangement within the growing nanowires were considered in the mechanism. We discussed these findings and present that the formation of the twinned SIC nanowires was the codetermined result of the screw dislocation induced growth, stacking faults of the {1 1 1} close-packed planes and surface energy minimization. (C) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:2335 / 2340
页数:6
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