Nanoscratch behavior of multi-layered films using molecular dynamics

被引:24
作者
Fang, Te-Hua [1 ,2 ]
Liu, Chien-Hung [2 ]
Shen, Siu-Tsen [3 ]
Prior, S. D. [4 ]
Ji, Liang-Wen [2 ]
Wu, Jia-Hung [1 ]
机构
[1] Natl Formosa Univ, Inst Mech & Electromech Engn, Yunlin 632, Taiwan
[2] Natl Formosa Univ, Inst Electroopt & Mat Sci, Yunlin 632, Taiwan
[3] Natl Formosa Univ, Dept Multimedia Design, Yunlin 632, Taiwan
[4] Middlesex Univ, Dept Prod Design & Engn, London N14 4YZ, England
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2008年 / 90卷 / 04期
关键词
D O I
10.1007/s00339-007-4351-8
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Molecular dynamics simulations are performed to study the plastic deformation, stress and chip formation of scratched multi-layered films. The results showed that stick-slip and work-hardening behaviors were observed during the scratching process. There was a pile-up of amorphous disordered debris atoms and shear rupture ahead of the probe and a clear side-flow on the lateral sides of the probe when the probe moved forward. Both the plastic energy and the adhesion increased with an increase in the scratching depth. The glide band of the interface was on the {111}< 110 > slip system with a maximum width of the glide band of about 1 nm. The strain energy stored in the deformed structure caused a higher stress region in the material in front of the tool edge, with a maximum stress of about 10 GPa. In addition, the mechanical response and thermal softness phenomenon are discussed.
引用
收藏
页码:753 / 758
页数:6
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共 16 条
  • [11] Scanning tunneling spectroscopy on organic semiconductors:: Experiment and model -: art. no. 045202
    Kemerink, M
    Alvarado, SF
    Müller, P
    Koenraad, PM
    Salemink, HWM
    Wolter, JH
    Janssen, RAJ
    [J]. PHYSICAL REVIEW B, 2004, 70 (04) : 045202 - 1
  • [12] Simulation of the nanoindentation of hard metal carbide layer systems - the case of nanostructured ultra-hard carbide layer systems
    Kizler, P.
    Schmauder, S.
    [J]. COMPUTATIONAL MATERIALS SCIENCE, 2007, 39 (01) : 205 - 213
  • [13] Mechanical characterization of micro/nanoscale structures for MEMS/NEMS applications using nanoindentation techniques
    Li, XD
    Bhushan, B
    Takashima, K
    Baek, CW
    Kim, YK
    [J]. ULTRAMICROSCOPY, 2003, 97 (1-4) : 481 - 494
  • [14] Second-moment interatomic potential for Al, Ni and Ni-Al alloys, and molecular dynamics application
    Papanicolaou, NI
    Chamati, H
    Evangelakis, GA
    Papaconstantopoulos, DA
    [J]. COMPUTATIONAL MATERIALS SCIENCE, 2003, 27 (1-2) : 191 - 198
  • [15] Assessing defect density and wear resistance of ultrathin diamond-like carbon films
    Scharf, TW
    Gong, J
    Zangari, G
    Barnard, JA
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2002, 74 (06): : 827 - 829
  • [16] Nano-scratch experiments of Au/NiCr multi-layered films for microwave integrated circuits
    Tang, Wu
    Weng, Xiaolong
    Deng, Longjiang
    Xu, Kewei
    Lu, Jian
    [J]. SURFACE & COATINGS TECHNOLOGY, 2007, 201 (9-11) : 5664 - 5666