共 13 条
Preparation and Characterization of TiO2-hybrid SiO2 Porous Film
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作者:

Liu, Qiang
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机构:
Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China

Zhu, Zhong-qi
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机构:
Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China

Zhang, Jin
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机构:
Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China

Liu, Qing-ju
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机构:
Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China

Chen, Juan
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机构:
Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China
机构:
[1] Yunnan Univ, Sch Phys Sci & Technol, Yunnan Key Lab Nanomat & Nanotechnol, Kunming 650091, Peoples R China
来源:
2009 SYMPOSIUM ON PHOTONICS AND OPTOELECTRONICS (SOPO 2009)
|
2009年
关键词:
thin films;
nano-porous;
sol-gel growth;
hybrid;
THIN-FILMS;
INTERFACE;
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Porous silicon films are currently under intense investigation for optical, photoelectric, thermal and electronic applications. In this work, the silica films have been prepared by a sol-gel process using a CTAB template. As an improvement, TiO(2) was doped in silica sol to produce the TiO(2)-hybrid SiO(2) Porous Film, and the hydrophobic activation of the film was carried out. The chemical and physical changes during sol-gel process were analyzed using DSC-TGA and FTIR. The structure and morphology of films were characterized by XRD and AFM. The experimental results show that the fabricated films have a nano-porous structure. The porous silica film (mean pore size 50 nm) is about 500 nm thick. The mechanical reliability of the film is well, and the contact angle of film is above 90 after hydrophobic activation.
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页码:838 / 841
页数:4
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