Measurement of linewidth enhancement factors for InGaAIAs laser diode by Fourier series expansion method

被引：9

作者：

Byrne, D. ^{[1
]}

Guo, W. H.

Phelan, R.

Lu, Q. Y.

Donegan, J. F.

Corbett, B.

机构：

[1] Univ Dublin Trinity Coll, Sch Phys, Semicond Photon Grp, Dublin 2, Ireland

[2] Univ Dublin Trinity Coll, CTVR, Dublin 2, Ireland

[3] CTVR, Cork, Ireland

[4] Natl Univ Ireland Univ Coll Cork, Tyndall Natl Inst, Cork, Ireland

来源：

ELECTRONICS LETTERS | 2007年 / 43卷 / 21期

关键词：

D O I：

10.1049/el:20072016

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The Fourier series expansion method is used to measure the linewidth enhancement factor of an InGaAIAs Fabry-Perot semiconductor laser from the below-threshold amplified spontaneous emission spectrum. It is shown that using this method, the linewidth enhancement factor can be obtained independently of the resolution bandwidth of the optical spectrum analyser.

引用

页码：1145 / 1146

页数：2

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