Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy - magnetic vs. dither piezo excitation

被引：21
作者：
Xu, Xin
Koslowski, Marisol
Raman, Arvind [1 ]
机构：
[1] Purdue Univ, Sch Mech Engn, W Lafayette, IN 47907 USA
来源：
JOURNAL OF APPLIED PHYSICS | 2012年 / 111卷 / 05期
基金：
美国国家科学基金会;
关键词：
NANOSCALE PROPERTY VARIATIONS; MECHANICAL-PROPERTIES; CANTILEVERS; INTERPHASE; LIQUID;
D O I：
10.1063/1.3689815
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Force modulation atomic force microscopy is widely used for mapping the nanoscale mechanical properties of heterogeneous or composite materials using low frequency excitation of a microcantilever scanning the surface. Here we show that the excitation mode - magnetic or dither piezo, has a major influence on the surface-coupled microcantilever dynamics. Not only is the observed material property contrast inverted between these excitation modes but also the frequency response of the surface-coupled cantilever in the magnetic mode is near-ideal with a clear resonance peak and little phase distortion thus enabling quantitative mapping of the local mechanical properties. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3689815]
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页数：5
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