The effect of neutron irradiation on the properties of n-InSb whisker microcrystals

被引:14
作者
Bolshakova, IA [1 ]
Boiko, VM
Brudnyi, VN
Kamenskaya, IV
Kolin, NG
Makido, EY
Moskovets, TA
Merkurisov, DI
机构
[1] Lviv Natl Polytech Univ, UA-290013 Lvov, Ukraine
[2] LY Karpov Phys Chem Res Inst, Obninsk 249033, Kaluga, Russia
[3] Tomsk VV Kuibyshev State Univ, Kuznetsov Physicotech Inst, Tomsk 634050, Russia
关键词
D O I
10.1134/1.1992633
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The results of studying the effect of irradiation with fast neutrons in an IBR-2 reactor on the characteristics of magnetic-field sensors based on n(+)-InSb whisker microcrystals are reported (the measurements were carried out in the course of the irradiation). The optimum concentration of free electrons n for providing the highest possible radiation resistance of the InSb sensors is estimated (n approximate to (6-7) x 10(17) cm(-3)). The contributions of two competing processes to variation in the electrical properties of InSb under neutron irradiation (transmutation-related doping of InSb with a Sn shallow-level donor impurity and compensation of the initial n(+)-InSb conductivity as a result of generation of deep-level acceptor-type radiation defects) are determined separately. (c) 2005 Pleiades Publishing, Inc.
引用
收藏
页码:780 / 785
页数:6
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