Improved Near-infrared Photoresponse of Si-based Schottky Diode by Nanophotonic Structures

被引:0
作者
Wen, Hanying [1 ]
Augel, Lion [1 ,2 ]
Knobbe, Jens [1 ]
机构
[1] Fraunhofer Inst Photon Microsyst IPMS, Cottbus, Germany
[2] Brandenburg Tech Univ Cottbus, Chair Micro & Nano Syst, Cottbus, Germany
来源
2022 45TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE) | 2022年
关键词
PHOTODETECTORS;
D O I
10.1109/ISSE54558.2022.9812807
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Schottky photodetectors based on internal photoemission enable the detection of infrared radiation beyond the spectral range of silicon pin diodes. Major drawbacks for many applications are the low quantum efficiency and the dark current. Among all approaches to solving these issues, this work focuses on nanophotonic structures to reduce the reflection of the device. We present a backside-illuminated AlSiCu/Si Schottky photodetector with nanopyramids in various sizes produced with a full CMOS compatible process. We found a Schottky barrier height of 0.59 eV while keeping dark current density low (under 1 A.m(-2) at 293 K) and we were able to show an improvement in optical responsivity by a factor of more than seven within the wavelength range from 1300 nm to 1600 nm compared to planar devices.
引用
收藏
页数:6
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