Emissivity correction using spectrum correlation of infrared and visible images

被引:26
作者
Gao, Yunlai [1 ,3 ]
Tian, Gui Yun [2 ]
机构
[1] Nanjing Univ Aeronaut & Astronaut, Coll Automat Engn, Nanjing 211106, Jiangsu, Peoples R China
[2] Univ Elect Sci & Technol China, Sch Automat Engn, Chengdu 611731, Sichuan, Peoples R China
[3] Newcastle Univ, Sch Engn, Newcastle Upon Tyne NE1 7RU, Tyne & Wear, England
基金
中国国家自然科学基金; 英国工程与自然科学研究理事会;
关键词
Thermography NDT&E; Emissivity correction; Spectrum correlation; Two cameras measurement; THERMOGRAPHY; TEMPERATURE; RECONSTRUCTION; SEPARATION; PYROMETRY;
D O I
10.1016/j.sna.2017.12.027
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Thermography is a typical sensing approach used for non-destructive testing and evaluation (NDT&E). However, the varying surface emissivity of an object leads to illusory temperature inhomogeneity which results in influences on defect detection. This paper proposes a new technique to correct the influence of the surface's varying emissivity of an object in active thermography. Two cameras operating at different spectra are used to capture infrared and visible images simultaneously. Although the physics behind infrared and optical imaging are very different, a close spectrum correlation of two images is identified. An invariant coefficient feature has been estimated for an emissivity correction of infrared images with suggested algorithm. The basic hypothesis is that the reflectance correlation is proposed to predict surface emissivity of an object with respect to wavelength. Experimental validation results show that after correction infrared images are looking like more homogeneous and independent of emissivity. It has been tested for a partially painted steel and rail samples with different known emissivity. Comparative analysis demonstrates its promising capability for accurate mapping of thermal patterns and defect evaluation in thermography NDT&E. (C) 2017 Elsevier B.V. All rights reserved.
引用
收藏
页码:8 / 17
页数:10
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