Piezoelectricity enhancement of P(VDF/TrFE) by X-ray irradiation

被引:4
作者
Pilet, N. [1 ]
Khikhlovskyi, V. [2 ]
van Breemen, A. J. J. M. [3 ]
Michels, J. J. [3 ,4 ]
Kemerink, M. [2 ,5 ]
Gelinck, G. [2 ,3 ]
Warnicke, P. [1 ]
Bernard, L. [6 ]
机构
[1] PSI, CH-5232 Villigen, Switzerland
[2] Eindhoven Univ Technol, Dept Appl Phys, POB 513, NL-5600 MB Eindhoven, Netherlands
[3] TNO Dutch Org Appl Sci Res, Holst Ctr, High Tech Campus 31, NL-5656 AE Eindhoven, Netherlands
[4] Max Planck Inst Polymer Res, Ackermannweg 10, D-55128 Mainz, Germany
[5] Linkping Univ, Dept Phys Chem & Biol IFM, SE-58183 Linkping, Sweden
[6] Swiss Fed Labs Mat Sci & Technol, Empa, CH-8600 Dubendorf, Switzerland
关键词
AFM; STXM; Organic memory; Piezoelectric polymer; Morphology; X-ray irradiation; Piezo force microscopy; P(VDF-TrFE); ORGANIC NONVOLATILE MEMORIES; PHASE-SEPARATED BLENDS; POLYMER BLENDS; THIN-FILMS; COMPOSITES; COPOLYMERS; MORPHOLOGY;
D O I
10.1016/j.orgel.2016.06.039
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Organic electronics is becoming more and more important because the low level of fabrication and deposition complexity even at large scale makes it a good candidate for future low cost technological product development. P(VDF-TrFE) is a co-polymer of special interest due its ferroelectric property enabling usage in re-programmable non-volatile organic memory and magnetoelectric sensors. Piezo force microscopy (PFM) provides access to the technologically relevant ferroelectric polarisability and its remanent polarization via imaging of the piezoelectric property. Here we use PFM to show that piezoelectric response of a P(VDF-TrFE) film can be enhanced by up to 260 % after soft X-ray irradiation. This enhancement correlates with morphological change of part of the film, from amorphous to crystalline. An optimal irradiation dose is found above which the film gets eroded and the piezoelectric response gets lowered. (C) 2016 Elsevier B.V. All rights reserved.
引用
收藏
页码:257 / 262
页数:6
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