Geant4 Analysis of n-Si Nuclear Reactions From Different Sources of Neutrons and Its Implication on Soft-Error Rate

被引：30

作者：

Serre, S. ^{[1
,2
]}

Semikh, S. ^{[3
]}

Uznanski, S. ^{[4
]}

Autran, J. L. ^{[1
,2
]}

Munteanu, D. ^{[1
,2
]}

Gasiot, G. ^{[4
]}

Roche, P. ^{[4
]}

机构：

[1] Aix Marseille Univ, F-13384 Marseille 13, France

[2] CNRS, UMR CNRS 6242, Inst Mat Microelect & Nanosci Provence IM2NP, F-13384 Marseille 13, France

[3] JINR, Dzhelepov Lab Nucl Problems, Dubna 141980, Moscow Region, Russia

[4] STMicroelectronics, F-38926 Crolles, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2012年 / 59卷 / 04期

关键词：

Cosmic-ray induced neutrons; Geant4; multiple cell upset; neutron beam testing; single-event upset; soft-error rate; SRAM; terrestrial neutron spectrum; SRAM;

D O I：

10.1109/TNS.2012.2189018

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This work examines nuclear events resulting from the interaction of atmospheric neutrons at ground level and different atmospheric-like sources with a silicon layer. Using extensive Geant4 simulations and in-depth data analysis, this study provides a detailed comparison between several facilities and natural environment in terms of nuclear processes, secondary ion production and fragment energy distribution. The different computed databases have been used in a second part of this work to estimate the Soft-Error Rate (SER) of a widely characterized 65 nm SRAM test circuit with the Tool suIte for rAdiation Reliability Assessment (TIARA Monte-Carlo simulation code). A detailed analysis is conducted to clarify the mechanisms leading to single and multiple cell upsets and to estimate the SER of a broad spectrum source from values obtained with monoenergetic simulations.

引用

页码：714 / 722

页数：9

共 13 条

[1] The Effects of Neutron Energy and High-Z Materials on Single Event Upsets and Multiple Cell Upsets [J].

Andrew, Michael ;

Sierawski, Brian D. ;

Warren, Kevin M. ;

Mendenhall, Marcus H. ;

Dodds, Nathaniel A. ;

Weller, Robert A. ;

Reed, Robert A. ;

Dodd, Paul E. ;

Shaneyfelt, Marty R. ;

Schwank, James R. ;

Wender, Stephen A. ;

Baumann, Robert C. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2011, 58 (06) :2591-2598

[2]

[Anonymous], 1989, JEDEC STAND MEAS REP

[3]

[Anonymous], 2004, SER-History, Trends and Challenges:A Guide for Designing With Memory ICs

[4] Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM [J].

Autran, J. L. ;

Roche, P. ;

Sauze, S. ;

Gasiot, G. ;

Munteanu, D. ;

Loaiza, P. ;

Zampaolo, M. ;

Borel, J. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2009, 56 (04) :2258-2266

[5] Improved capabilities for proton and neutron irradiations at TRIUMF [J].

Blackmore, EW ;

Dodd, PE ;

Shaneyfelt, MR .

2003 IEEE RADIATION EFFECTS DATA WORKSHOP RECORD, 2003, :149-155

[6] Innovative simulations of heavy ion cross sections in 130 nm CMOS SRAM [J].

Correas, Vincent ;

Saigne, F. ;

Sagnes, B. ;

Boch, J. ;

Gasiot, G. ;

Giot, D. ;

Roche, P. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2007, 54 (06) :2413-2418

[7] THE LOS-ALAMOS-NATIONAL-LABORATORY SPALLATION NEUTRON SOURCES [J].

LISOWSKI, PW ;

BOWMAN, CD ;

RUSSELL, GJ ;

WENDER, SA .

NUCLEAR SCIENCE AND ENGINEERING, 1990, 106 (02) :208-218

[8]

Normand E., 2010, P IEEE RAD EFF DAT W, P50

[9] FIDELITY OF ENERGY SPECTRA AT NEUTRON FACILITIES FOR SINGLE-EVENT EFFECTS TESTING [J].

Platt, S. P. ;

Prokofiev, A. V. ;

Xiao, Cai Xiao .

2010 INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, 2010, :411-416

[10] ANITA - a New Neutron Facility for Accelerated SEE Testing at The Svedberg Laboratory [J].

Prokofiev, Alexander V. ;

Blomgren, Jan ;

Platt, Simon P. ;

Nolte, Ralf ;

Roettger, Stefan ;

Smimov, Andrey N. .

2009 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, VOLS 1 AND 2, 2009, :929-+

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