Geant4 Analysis of n-Si Nuclear Reactions From Different Sources of Neutrons and Its Implication on Soft-Error Rate

被引：30

作者：

Serre, S. ^{[1
,2
]}

Semikh, S. ^{[3
]}

Uznanski, S. ^{[4
]}

Autran, J. L. ^{[1
,2
]}

Munteanu, D. ^{[1
,2
]}

Gasiot, G. ^{[4
]}

Roche, P. ^{[4
]}

机构：

[1] Aix Marseille Univ, F-13384 Marseille 13, France

[2] CNRS, UMR CNRS 6242, Inst Mat Microelect & Nanosci Provence IM2NP, F-13384 Marseille 13, France

[3] JINR, Dzhelepov Lab Nucl Problems, Dubna 141980, Moscow Region, Russia

[4] STMicroelectronics, F-38926 Crolles, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2012年 / 59卷 / 04期

关键词：

Cosmic-ray induced neutrons; Geant4; multiple cell upset; neutron beam testing; single-event upset; soft-error rate; SRAM; terrestrial neutron spectrum; SRAM;

D O I：

10.1109/TNS.2012.2189018

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This work examines nuclear events resulting from the interaction of atmospheric neutrons at ground level and different atmospheric-like sources with a silicon layer. Using extensive Geant4 simulations and in-depth data analysis, this study provides a detailed comparison between several facilities and natural environment in terms of nuclear processes, secondary ion production and fragment energy distribution. The different computed databases have been used in a second part of this work to estimate the Soft-Error Rate (SER) of a widely characterized 65 nm SRAM test circuit with the Tool suIte for rAdiation Reliability Assessment (TIARA Monte-Carlo simulation code). A detailed analysis is conducted to clarify the mechanisms leading to single and multiple cell upsets and to estimate the SER of a broad spectrum source from values obtained with monoenergetic simulations.

引用

页码：714 / 722

页数：9