Investigation of layer structure of MHPOBC free-standing film by transmission ellipsometry

被引：0
|
作者：
Okumoto, Y [1 ]
Kimura, M
Akahane, T
Masuhashi, N
机构：
[1] Nagaoka Univ Tech, Dept Elect Engn, Niigata 9402188, Japan
[2] Hachinohe Natl Coll Tech, Dept Elect Engn, Hachinohe, Aomori 0391104, Japan
来源：
MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 2001年 / 365卷
关键词：
free standing Film; ellipsometry; antiferroelectric liquid crystal;
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
Thin MHPOBC Free-Standing Film (FSF) was investigated by transmission ellipsometry. It was found that the temperature at which the remarkable change of A occurs increases with decreasing the layer number, and some of the subphase disappeared in case of thin FSF The layer thickness of thin FSF was 2.5 nm which is shorter than the molecular length, and was not depend on the tilt angle.
引用
收藏
页码：1791 / 1800
页数：10
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