Band structure, effective mass, and carrier mobility of few-layer h-AlN under layer and strain engineering

被引:45
作者
Cai, Yao [1 ]
Liu, Yan [1 ]
Xie, Ying [1 ]
Zou, Yang [1 ]
Gao, Chao [1 ]
Zhao, Yan [1 ]
Liu, Sheng [1 ]
Xu, Hongxing [2 ]
Shi, Jian [3 ]
Guo, Shishang [2 ]
Sun, Chengliang [1 ]
机构
[1] Wuhan Univ, Inst Technol Sci, Wuhan 430072, Peoples R China
[2] Wuhan Univ, Sch Phys & Technol, Minist Educ, Key Lab Artificial Micro & Nanostruct, Wuhan 430072, Peoples R China
[3] Rensselaer Polytech Inst, Dept Mat Sci & Engn, Troy, NY 12180 USA
基金
中国国家自然科学基金;
关键词
MONOLAYER MOS2; DIODE; BN;
D O I
10.1063/1.5139664
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Wide bandgap two-dimensional semiconductors are of paramount importance for developing van der Waals heterostructure electronics. This work reports the use of layer and strain engineering to introduce the feasibility of two-dimensional hexagonal (h)-AlN to fill the scientific and application gap. We show that such one- to five-layer h-AlN has an indirect bandgap, tunable from 2.9 eV for a monolayer to similar to 3.5 eV for multilayer structures, along with isotropic effective masses and carrier mobilities between zigzag and armchair directions. With an increase in the layer number to bulk AlN, the bandgap will experience a transition from an indirect gap to direct gap. Surprisingly, high room-temperature mobilities of electrons and holes (of the order of 1000 cm(2) V-1 s(-1)) in a relaxed monolayer h-AlN system and widely adjustable effective masses and carrier mobilities in a different layer h-AlN are observed. In the presence of strain engineering, the bandgap decreases obviously with an increase in tensile strain; meanwhile, the isotropy and value of effective mass or carrier mobility in monolayer h-AlN can also be modulated effectively; the hole mobilities in the armchair direction, especially, will be enhanced dramatically. With a tunable bandgap, high carrier mobilities, and modifiable isotropy, our results indicate that few-layer h-AlN has potential applications in future mechano-electronic devices. (C) 2020 Author(s).
引用
收藏
页数:8
相关论文
共 44 条
[1]   Hexagonal AlN: Dimensional-crossover-driven band-gap transition [J].
Bacaksiz, C. ;
Sahin, H. ;
Ozaydin, H. D. ;
Horzum, S. ;
Senger, R. T. ;
Peeters, F. M. .
PHYSICAL REVIEW B, 2015, 91 (08)
[2]   DEFORMATION POTENTIALS AND MOBILITIES IN NON-POLAR CRYSTALS [J].
BARDEEN, J ;
SHOCKLEY, W .
PHYSICAL REVIEW, 1950, 80 (01) :72-80
[3]   Strain Tunable Band-gaps Of Two-dimensional Hexagonal BN And AlN: An FP-(L)APW plus lo Study [J].
Behera, Harihar ;
Mukhopadhyay, Gautam .
SOLID STATE PHYSICS, PTS 1 AND 2, 2012, 1447 :273-274
[4]   Ab-initio simulations of deformation potentials and electron mobility in chemically modified graphene and two-dimensional hexagonal boron-nitride [J].
Bruzzone, Samantha ;
Fiori, Gianluca .
APPLIED PHYSICS LETTERS, 2011, 99 (22)
[5]   Polarity-Reversed Robust Carrier Mobility in Monolayer MoS2 Nanoribbons [J].
Cai, Yongqing ;
Zhang, Gang ;
Zhang, Yong-Wei .
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 2014, 136 (17) :6269-6275
[6]   Tailoring band gap in GaN sheet by chemical modification and electric field: Ab initio calculations [J].
Chen, Qian ;
Hu, Hong ;
Chen, Xiaojie ;
Wang, Jinlan .
APPLIED PHYSICS LETTERS, 2011, 98 (05)
[7]   First principles methods using CASTEP [J].
Clark, SJ ;
Segall, MD ;
Pickard, CJ ;
Hasnip, PJ ;
Probert, MJ ;
Refson, K ;
Payne, MC .
ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2005, 220 (5-6) :567-570
[8]   Defects in hexagonal-AlN sheets by first-principles calculations [J].
de Almeida Junior, E. F. ;
de Brito Mota, F. ;
de Castilho, C. M. C. ;
Kakanakova-Georgieva, A. ;
Gueorguiev, G. K. .
EUROPEAN PHYSICAL JOURNAL B, 2012, 85 (01)
[9]   Strain engineering in two-dimensional nanomaterials beyond graphene [J].
Deng, Shikai ;
Sumant, Anirudha V. ;
Berry, Vikas .
NANO TODAY, 2018, 22 :14-35
[10]   Van der Waals stacks of few-layer h-AlN with graphene: an ab initio study of structural, interaction and electronic properties [J].
dos Santos, Renato B. ;
de Brito Mota, F. ;
Rivelino, R. ;
Kakanakova-Georgieva, A. ;
Gueorguiev, G. K. .
NANOTECHNOLOGY, 2016, 27 (14)