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Observation of Band Gap in Epitaxial Bilayer Graphene Field Effect Transistors
被引:17
|作者:
Tanabe, Shinichi
[1
]
Sekine, Yoshiaki
[1
]
Kageshima, Hiroyuki
[1
]
Nagase, Masao
[1
]
Hibino, Hiroki
[1
]
机构:
[1] NTT Corp, NTT Basic Res Labs, Kanagawa 2430198, Japan
关键词:
ELECTRIC-FIELD;
D O I:
10.1143/JJAP.50.04DN04
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Bilayer graphene was grown on the Si-face of SiC by thermal decomposition. Its electronic properties were investigated in top-gate Hall bar devices. By controlling the carrier density using gate voltage, we were able to access the charge neutrality point. The conductance at the charge neutrality point showed a strong temperature dependence, and its temperature dependence was well fitted with thermal activation and variable-range hopping mechanisms. The electrical detection of a band gap opening in bilayer graphene grown on SiC is a promising step toward the realization of graphene-based electronics using epitaxial graphene. (C) 2011 The Japan Society of Applied Physics
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