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- [3] Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy Analytical Sciences, 2002, 18 : 227 - 242
- [5] INELASTIC ELECTRON-TUNNELING SPECTROSCOPY ON MOS STRUCTURES WITH VERY THIN OXIDE-FILMS ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1985, 59 (04): : 439 - 443
- [6] AN XPS INVESTIGATION OF ALUMINA THIN-FILMS UTILIZED IN INELASTIC ELECTRON-TUNNELING SPECTROSCOPY APPLICATIONS OF SURFACE SCIENCE, 1980, 5 (03): : 258 - 274