Loss Analysis of Wideband RF MEMS Shunt Capacitive Switch in T and II-Match Configurations

被引:0
作者
Suganthi, S.
Selvan, P. Thiruvalar
Raghavan, S.
机构
[1] K Ramakrishnan Coll Technol, Dept Elect & Commun Engn, Tiruchirappalli, Tamil Nadu, India
[2] SRM TRP Engn Coll, Dept Elect & Commun Engn, Tiruchirappalli, Tamil Nadu, India
[3] Natl Inst Technol, Dept Elect & Commun Engn, Tiruchirappalli, Tamil Nadu, India
来源
APPLIED COMPUTATIONAL ELECTROMAGNETICS SOCIETY JOURNAL | 2018年 / 33卷 / 09期
关键词
High impedance short transmission line; matched section; return loss and isolation; RF MEMS; shunt switch; wideband;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A wide bandwidth coplanar-waveguide (CPW) based RF MEMS capacitive shunt switch with pi-matched & T-matched having high impedance transmission lines is designed and simulated for broadband (18-40 GHz) application. The effects of variation in membrane width (50 & 70 mu m) of the switch and high-impedance transmission line length (300 - 600 mu m) between the switch structures on scattering parameters are studied. The variation in beam width has very little effect on return loss of the switch in up-state. The reduction in high-impedance transmission line length yields marginal improvement in return loss. In the down-state configuration, the return loss showed negligible change with the variation in beam width and high-impedance transmission line length. The isolation is found improved with the increase in beam width and high-impedance transmission line length in whole frequency range. Simulating the technical performance demonstrates the greater improvement in RF characteristics of the switch particularly in return loss in up-state position. In order to validate the obtained result, Artificial Neural Network (ANN) has been trained using ADS result. Comparison shows good agreement between ADS and ANN results.
引用
收藏
页码:1034 / 1039
页数:6
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