Suppression of the High-Frequency Errors in Surface Topography Measurements Based on Comparison of Various Spline Filtering Methods

被引:23
作者
Podulka, Przemyslaw [1 ]
机构
[1] Rzeszow Univ Technol, Fac Mech Engn & Aeronaut, Powstancow Warszawy 8 St, PL-35959 Rzeszow, Poland
关键词
surface topography; surface metrology; measurement errors; spline; spline filter; modelled data; raw measured data; EMPIRICAL MODE DECOMPOSITION; POWER SPECTRAL DENSITY; NOISE; APPROXIMATIONS; COMPUTATION; DEFINITION; ALGORITHMS; SEPARATION; TRANSFORM; METROLOGY;
D O I
10.3390/ma14175096
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The metrology of so-called "engineering surfaces" is burdened with a substantial risk of both measurement and data analysis errors. One of the most encouraging issues is the definition of frequency-defined measurement errors. This paper proposes a new method for the suppression and reduction of high-frequency measurement errors from the surface topography data. This technique is based on comparisons of alternative types of noise detection procedures with the examination of profile (2D) or surface (3D) details for both measured and modelled surface topography data. In this paper, the results of applying various spline filters used for suppressions of measurement noise were compared with regard to several kinds of surface textures. For the purpose of the article, the influence of proposed approaches on the values of surface topography parameters (from ISO 25178 for areal and ISO 4287 for profile standards) was also performed. The effect of the distribution of some features of surface texture on the results of suppressions of high-frequency measurement noise was also closely studied. Therefore, the surface topography analysis with Power Spectral Density, Autocorrelation Function, and novel approaches based on the spline modifications or studies of the shape of an Autocorrelation Function was presented.
引用
收藏
页数:37
相关论文
共 114 条
  • [1] Freeform surface filtering using the lifting wavelet transform
    Abdul-Rahman, Hussein S.
    Jiang, Xiangqian Jane
    Scott, Paul J.
    [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2013, 37 (01): : 187 - 202
  • [2] Using the Power Spectral Density method to characterise the surface topography of optical surfaces
    Alcock, Simon G.
    Ludbrook, Geoff D.
    Owen, Tommy
    Dockree, Richard
    [J]. ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS III, 2010, 7801
  • [3] [Anonymous], ISO ISO 25178 22012
  • [4] [Anonymous], 2016, 16610282016 ISO 28
  • [5] [Anonymous], 2012, 2517832012 ISO 3
  • [6] [Anonymous], 2014, 251786002014E IS 600
  • [7] [Anonymous], 2015, 16610222015 ISO 22
  • [8] [Anonymous], 2019, ISO 25178-600
  • [9] [Anonymous], 1997, 4287 ISO
  • [10] Investigating the quality inspection process of offshore wind turbine blades using B-spline surfaces
    Auger, Dominic
    Wang, Qing
    Trevelyan, Jon
    Huang, Songling
    Zhao, Wei
    [J]. MEASUREMENT, 2018, 115 : 162 - 172