Measurements of adsorption strain in porous silicon by Raman scattering

被引：0

作者：

Ferrara, M. A. ^{[1
,2
]}

Sirleto, L. ^{[1
]}

Messina, G. ^{[2
]}

Donato, M. G. ^{[2
]}

Santangelo, S. ^{[2
]}

Rendina, I. ^{[1
]}

机构：

[1] IMM CNR, Via P Castellino 111, I-80131 Naples, Italy

[2] Univ Mediterranea Reggio Calabria, I-89060 Reggio Di Calabria, Italy

来源：

THIRD EUROPEAN WORKSHOP ON OPTICAL FIBRE SENSORS | 2007年 / 6619卷

关键词：

porous silicon; strain measurements; Raman scattering;

D O I：

10.1117/12.738402

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The stress in porous silicon during exposition to a liquid is investigated by an approach based on Raman scattering. When the porous silicon structure is exposed to isopropanol or ethanol, a reversible blue shift of the Raman spectra is observed. The blue shift of Raman scattering is ascribed to the contraction induced by the liquids that fill the pores.

引用

页数：4

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