Structural study by X-ray diffraction and transmission electron microscopy of the misfit compound (SbS1-xSex)1.16(Nb1.036S2)2

被引:9
|
作者
Kars, Mohammed [1 ]
Fredrickson, Daniel C. [2 ]
Gomez-Herrero, A. [3 ]
Lidin, Sven [2 ]
Rebbah, Allaoua [1 ]
Otero-Diaz, L. C. [3 ,4 ]
机构
[1] USTHB, Mat Sci Lab, Fac Chim, Algiers 16000, Algeria
[2] Stockholm Univ, Arrhenius Lab, S-10691 Stockholm, Sweden
[3] Univ Complutense, Ctr Microscopia Elect, E-28040 Madrid, Spain
[4] Univ Complutense, Fac CC Qium, Dpto Inorgan, E-28040 Madrid, Spain
关键词
Layered compound; Crystal growth; X-ray diffraction; Crystal structure; Electron microscopy; (3+2)-DIMENSIONAL SUPERSPACE APPROACH; CRYSTAL-STRUCTURE DETERMINATION; LAYER COMPOUND; TRANSPORT-PROPERTIES; PHYSICAL-PROPERTIES; NB; PB;
D O I
10.1016/j.materresbull.2010.04.011
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In the Sb-Nb-S-Se system, a new misfit layer compound (MSL) has been synthesized and its structure was determined by combining single crystal X-ray diffraction (XRD) and transmission electron microscopy (TEM) techniques. It presents a composite crystal structure formed by (SbS1-xSex)slabs stacking alternately with double NbS2 layers and both can be treated as separate monoclinic subsystems. The (SbS1-xSex) slabs comprise a distorted, two-atom-thick layer with NaCl-type structure formed by an array of (SbX5) square pyramids joined by edges (X: S, Se); the NbS2 layers consist of (SbX5) trigonal prisms linked through edge-sharing to form sheets, just as in the 2H-NbS2 structure type. Both sublattices have the same lattice parameters a = 5.7672(19) angstrom, c = 17.618(6) angstrom and beta = 96.18(3)degrees, with incommensurability occurring along the b direction: b(1) = 3.3442(13) angstrom for the NbS2 subsystem and b(2) = 2.8755(13) angstrom for the (SbS1-xSex) subsystem. The occurrence of diffuse scattering intensity streaked along c* indicates that the (SbS1-xSex) subsystem is subjected to extended defects along the stacking direction. Published by Elsevier Ltd.
引用
收藏
页码:982 / 988
页数:7
相关论文
共 50 条
  • [1] Transmission electron microscopy and X-ray diffraction studies of Al2CO microcrystals
    Dluzewski, PA
    Górecka, J
    Kozlowski, M
    Paszkowicz, W
    Yamaguchi, A
    MATERIALS CHEMISTRY AND PHYSICS, 2003, 81 (2-3) : 383 - 386
  • [2] X-ray diffraction and transmission electron microscopy of Morquio syndrome type A cornea: A structural analysis
    Rawe, IM
    Leonard, DW
    Meek, KM
    Zabel, RW
    CORNEA, 1997, 16 (03) : 369 - 376
  • [3] Defect structure study of epitaxial InN films by transmission electron microscopy and X-ray diffraction
    Chen, Wei-Li
    Wang, Yan-Hsin
    Chen, Ming-Fei
    Huang, Man-Fang
    Fan, Jenn-Chyuan
    PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, 2010, 42 (05) : 1463 - 1468
  • [4] STRUCTURAL ANALYSIS OF CuInSe2, CuInTe2 and CuInSeTe BY ELECTRON MICROSCOPY AND X-RAY TECHNIQUES
    Leon, M.
    Merino, J. M.
    Van Tendeloo, G.
    ACTA MICROSCOPICA, 2009, 18 (02): : 128 - 138
  • [5] Structural characterization of "as-deposited" cesium iodide films studied by X-ray diffraction and transmission electron microscopy techniques
    Garg, Triloki P.
    Rai, R.
    Singh, B. K.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2014, 736 : 128 - 134
  • [6] Size Distribution of SnO2 Quantum Dots Studied by UV–Visible, Transmission Electron Microscopy and X-Ray Diffraction
    Venkataramana Bonu
    A. Das
    MAPAN, 2013, 28 : 259 - 262
  • [7] High-Temperature Transmission Electron Microscopy and X-Ray Powder Diffraction Studies of Polymorphic Phase Transitions in Ba4Nb2O9
    Bezjak, Jana
    Recnik, Aleksander
    Jancar, Bogtjan
    Boullay, Philippe
    Evans, Ivana Radosavljevic
    Suvorov, Danilo
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2009, 92 (08) : 1806 - 1812
  • [8] High-temperature structural phase transition in Ca2Fe2O5 studied by in-situ X-ray diffraction and transmission electron microscopy
    Krueger, Hannes
    Kahlenberg, Volker
    Petricek, Vaclav
    Phillipp, Fritz
    Wertl, Waltraud
    JOURNAL OF SOLID STATE CHEMISTRY, 2009, 182 (06) : 1515 - 1523
  • [9] Structural and In Situ X-ray Diffraction Study of Hydrogenation of CaxMg1-xNi2 (0 ≤ x ≤ 1)
    Rehman, Zia Ur
    Nawaz, Mohsan
    Ullah, Hameed
    Ahmad, Pervaiz
    Khandaker, Mayeen Uddin
    Idris, Abubakr M.
    Haq, Sirajul
    Sulieman, Abdelmoneim
    CRYSTALS, 2022, 12 (01)
  • [10] High-temperature X-ray diffraction study of Ag2S-Cu2S system
    Asadov, Y. G.
    Aliyev, Y. I.
    Dashdemirov, A. O.
    Jabarov, S. H.
    Naghiyev, T. G.
    MODERN PHYSICS LETTERS B, 2020, 34