Improving Fault Isolatioin using Iterative Diagnosis

被引：17

作者：

Gearhardt, Kevin ^{[1
]}

Schuermyer, Chris ^{[2
]}

Guo, Ruifeng ^{[2
]}

机构：

[1] LSI Logic Corp, Ft Collins, CO 80525 USA

[2] Mentor Graph Corp, Wilsonville, OR 97070 USA

来源：

ISTFA 2008: CONFERENCE PROCEEDINGS FROM THE 34TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS | 2008年

关键词：

D O I：

10.1361/cp2008istfa390

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

This paper presents an iterative diagnosis test generation framework to improve logic fault diagnosis resolution. Industrial examples are presented in this paper on how additional targeted pattern generation can be used to improve defect localization before physical failure analysis of a die. This enables failure analysts to be more effective by reducing the dependence on the more expensive physical fault isolation techniques.

引用

页码：390 / +

页数：2

共 23 条

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