Stimulated Brillouin scattering-induced phase noise is harmful to interferometric fiber sensing systems. The localized fluctuating model is used to study the intensity noise caused by the stimulated Brillouin scattering in a single-mode fiber. The phase noise structure is analyzed for an interferometric fiber sensing system, and an unbalanced Michelson interferometer with an optical path difference of 1 m, as well as the phase-generated carrier technique, is used to measure the phase noise. It is found that the phase noise is small when the input power is below the stimulated Brillouin scattering threshold, increases dramatically at first and then gradually becomes flat when the input power is above the threshold, which is similar to the variation in relative intensity noise. It can be inferred that the increase in phase noise is mainly due to the broadening of the laser linewidth caused by stimulated Brillouin scattering, which is verified through linewidth measurements in the absence and presence of the stimulated Brillouin scattering.
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Department of Optic Information Science and Technology,College of Optoelectronic Science and Engineering,National University of Defense TechnologyDepartment of Optic Information Science and Technology,College of Optoelectronic Science and Engineering,National University of Defense Technology
陈伟
孟洲
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Department of Optic Information Science and Technology,College of Optoelectronic Science and Engineering,National University of Defense TechnologyDepartment of Optic Information Science and Technology,College of Optoelectronic Science and Engineering,National University of Defense Technology
孟洲
周会娟
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Department of Optic Information Science and Technology,College of Optoelectronic Science and Engineering,National University of Defense TechnologyDepartment of Optic Information Science and Technology,College of Optoelectronic Science and Engineering,National University of Defense Technology
周会娟
罗洪
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Department of Optic Information Science and Technology,College of Optoelectronic Science and Engineering,National University of Defense TechnologyDepartment of Optic Information Science and Technology,College of Optoelectronic Science and Engineering,National University of Defense Technology
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Seoul Natl Univ, Dept Elect & Comp Engn, Seoul 08826, South KoreaSeoul Natl Univ, Dept Elect & Comp Engn, Seoul 08826, South Korea
Kim, Byung Ho
Park, Kyoungyoon
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Seoul Natl Univ, Dept Elect & Comp Engn, Seoul 08826, South KoreaSeoul Natl Univ, Dept Elect & Comp Engn, Seoul 08826, South Korea
Park, Kyoungyoon
Jeong, Yoonchan
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Seoul Natl Univ, Dept Elect & Comp Engn, Seoul 08826, South Korea
Seoul Natl Univ, ISRC, Seoul 08826, South Korea
Seoul Natl Univ, BK21Four, Seoul 08826, South KoreaSeoul Natl Univ, Dept Elect & Comp Engn, Seoul 08826, South Korea
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Normandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, FranceNormandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, France
Hanzard, Pierre-Henry
Talbi, Mohamed
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Normandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, FranceNormandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, France
Talbi, Mohamed
Mallek, Djouher
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Univ Sci & Technol H Boumediene, Laboratoire Electron Quant, Bab Ezzouar, Algiers, AlgeriaNormandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, France
Mallek, Djouher
Kellou, Abdelhamid
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Univ Sci & Technol H Boumediene, Laboratoire Electron Quant, Bab Ezzouar, Algiers, AlgeriaNormandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, France
Kellou, Abdelhamid
Leblond, Herve
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Univ dAngers, Laboratoire Photon Angers EA 4464, Angers, FranceNormandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, France
Leblond, Herve
Sanchez, Francois
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Univ dAngers, Laboratoire Photon Angers EA 4464, Angers, FranceNormandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, France
Sanchez, Francois
Godin, Thomas
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Normandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, FranceNormandie Univ, CNRS INSA Univ Rouen, CORIA UMR 6614, St Etienne Du Rouvray, France