The Role of Dopant Concentration on Conductivity and Mobility of CdTe Thin Films

被引:21
作者
Al-Douri, Ala J. [1 ]
Al-Shakily, F. Y. [2 ]
Alnajjar, Abdalla A. [1 ]
Alias, Maysoon F. A. [3 ]
机构
[1] Univ Sharjah, Coll Sci, Dept Appl Phys, Sharjah, U Arab Emirates
[2] Al Mustansirya Univ, Coll Educ, Dept Phys, Baghdad, Iraq
[3] Al Mustansirya Univ, Coll Sci, Dept Phys, Baghdad, Iraq
关键词
CHEMICAL-VAPOR-DEPOSITION; OPTICAL-PROPERTIES; GROWTH;
D O I
10.1155/2011/910967
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Films of CdTe pure and doped with various atomic percentages of Al and Sb (0.5, 1.5 & 2.5) were prepared, and their electrical properties were investigated. The films were prepared by thermal evaporation on glass substrates at two substrate temperatures (T-s = RT & 423 K). The results showed that the conduction phenomena of all the investigated CdTe thin films on glass substrates are caused by two distinct mechanisms. Room temperature DC conductivity increases by a factor of four for undoped CdTe thin films as T-s increases and by 1-2 orders of magnitude with increasing dopant percentage of Al and Sb. In general, films doped with Sb are more efficient than Al-doped films. The activation energy (E-a2) decreases with increasing T-s and dopant percentage for both Al and Sb. Undoped CdTe films deposited at RT are p-type convert to n-type with increasing T-s and upon doping with Al at more than 0.5%. The carrier concentration decreases as T-s increases while it increases with increasing dopant percentage. Hall mobility decreases more than three times as Al increases whereas it increases about one order of magnitude with increasing Sb percentage in CdTe thin films deposited at 423 K and RT, respectively.
引用
收藏
页数:6
相关论文
共 29 条
[21]   Twin coarsening in CdTe(111) films grown on GaAs(100) [J].
Polop, C. ;
Mora-Sero, I. ;
Munuera, C. ;
de Andres, J. Garcia ;
Munoz-Sanjose, V. ;
Ocal, C. .
ACTA MATERIALIA, 2006, 54 (16) :4285-4291
[22]  
RASHEED M, 1993, THESIS U BAGHDAD BAG
[23]  
Rusu GG, 2005, J OPTOELECTRON ADV M, V7, P1957
[24]  
Rusu GG, 2001, J OPTOELECTRON ADV M, V3, P861
[25]   Current-voltage characteristics of Ag, Al, Ni-(n)CdTe junctions [J].
Sarmah, PC ;
Rahman, A .
BULLETIN OF MATERIALS SCIENCE, 2001, 24 (04) :411-414
[26]  
SHEHAB A, 1985, THESIS U BAGHDAD BAG
[27]  
Sundari ST, 2000, PHYS STATUS SOLIDI A, V177, P495, DOI 10.1002/(SICI)1521-396X(200002)177:2<495::AID-PSSA495>3.0.CO
[28]  
2-3
[29]   Structure of the CdTe/Cd0.959Zn0.041Te, Hg1-xCdxTe/CdTe, CdTe/GaAs heterojunctions [J].
Yu, FJ .
JOURNAL OF CRYSTAL GROWTH, 1999, 205 (03) :264-269