A Strategy for Wafer-Scale Crystalline MoS2 Thin Films with Controlled Morphology Using Pulsed Metal-Organic Chemical Vapor Deposition at Low Temperature

被引:16
作者
Choi, Jeong-Hun [1 ]
Ha, Min-Ji [1 ]
Park, Jae Chan [1 ]
Park, Tae Joo [1 ]
Kim, Woo-Hee [1 ]
Lee, Myoung-Jae [2 ]
Ahn, Ji-Hoon [1 ]
机构
[1] Hanyang Univ, Dept Mat Sci & Chem Engn, 55 Hanyangdaehak Ro, Ansan 15588, Gyeonggi Do, South Korea
[2] Daegu Gyeongbuk Inst Sci & Technol DGIST, Inst Convers, 333 Techno Jungang Daero, Daegu 42988, South Korea
基金
新加坡国家研究基金会;
关键词
low temperature film growth; molybdenum disulfides; morphology control in MoS; (2) thin films; pulsed metal-organic chemical vapor deposition; transition metal dichalcogenides; SINGLE-LAYER MOS2; GAS-ADSORPTION; GROWTH; PHOTOLUMINESCENCE; PHOTODETECTOR; TRANSISTORS; MECHANISMS; NUCLEATION; NANOSHEETS; MONOLAYER;
D O I
10.1002/admi.202101785
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
2D semiconductor materials with layered crystal structures have attracted great interest as promising candidates for electronic, optoelectronic, and sensor applications due to their unique and superior characteristics. However, a large-area synthesis process for various applications and practical mass production is still lacking. In particular, there is a limitation in that a high process temperature and a very long process time are required to deposit a crystallized 2D material on a large area. Herein, pulsed metal-organic chemical vapor deposition (p-MOCVD) is proposed for the growth of wafer-scale crystalline MoS2 thin films to overcome the existing limitations. In the p-MOCVD process, precursors are repeatedly injected at regular intervals to enhance the migration of precursors on the surface. As a result, crystalline MoS2 is successfully synthesized at the lowest temperature (350 degrees C) reported so far in a very short process time of 550 s. In addition, it is found that the horizontal and vertical growth modes of MoS2 can be effectively controlled by adjusting key process parameters. Finally, various applications are presented by demonstrating the photodetector (detectivity = 18.1 x 10(6) at light power of 1 mW) and chemical sensor (response = 38% at 100 ppm of NO2 gas) devices.
引用
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页数:11
相关论文
共 56 条
  • [1] Acerce M, 2015, NAT NANOTECHNOL, V10, P313, DOI [10.1038/nnano.2015.40, 10.1038/NNANO.2015.40]
  • [2] Controlled Growth of MoS2 Flakes from in-Plane to Edge-Enriched 3D Network and Their Surface-Energy Studies
    Agrawal, Abhay V.
    Kumar, Naveen
    Venkatesan, Swaminathan
    Zakhidov, Alex
    Manspeaker, Christopher
    Zhu, Zhuan
    Hernandez, F. C. Robles
    Bao, Jiming
    Kumar, Mukesh
    [J]. ACS APPLIED NANO MATERIALS, 2018, 1 (05): : 2356 - 2367
  • [3] [Anonymous], NIOSH Pocket Guide to Chemical Hazards
  • [4] Probing the Origin and Suppression of Vertically Oriented Nanostructures of 2D WS2 Layers
    Balasubramanyam, Shashank
    Bloodgood, Matthew A.
    van Ommeren, Mark
    Faraz, Tahsin
    Vandalon, Vincent
    Kessels, Wilhelmus M. M.
    Verheijen, Marcel A.
    Bol, Ageeth A.
    [J]. ACS APPLIED MATERIALS & INTERFACES, 2020, 12 (03) : 3873 - 3885
  • [5] Highly Enhanced Gas Adsorption Properties in Vertically Aligned MoS2 Layers
    Cho, Soo-Yeon
    Kim, Seon Joon
    Lee, Youhan
    Kim, Jong-Seon
    Jung, Woo-Bin
    Yoo, Hae-Wook
    Kim, Jihan
    Jung, Hee-Tae
    [J]. ACS NANO, 2015, 9 (09) : 9314 - 9321
  • [6] WS2 thin films by metal organic chemical vapor deposition
    Chung, JW
    Dai, ZR
    Ohuchi, FS
    [J]. JOURNAL OF CRYSTAL GROWTH, 1998, 186 (1-2) : 137 - 150
  • [7] USE OF RAMAN-SCATTERING TO INVESTIGATE DISORDER AND CRYSTALLITE FORMATION IN AS-DEPOSITED AND ANNEALED CARBON-FILMS
    DILLON, RO
    WOOLLAM, JA
    KATKANANT, V
    [J]. PHYSICAL REVIEW B, 1984, 29 (06): : 3482 - 3489
  • [8] Photoluminescence from Chemically Exfoliated MoS2
    Eda, Goki
    Yamaguchi, Hisato
    Voiry, Damien
    Fujita, Takeshi
    Chen, Mingwei
    Chhowalla, Manish
    [J]. NANO LETTERS, 2011, 11 (12) : 5111 - 5116
  • [9] Photogating in Low Dimensional Photodetectors
    Fang, Hehai
    Hu, Weida
    [J]. ADVANCED SCIENCE, 2017, 4 (12)
  • [10] SINGLE CRYSTALS OF MOS2 SEVERAL MOLECULAR LAYERS THICK
    FRINDT, RF
    [J]. JOURNAL OF APPLIED PHYSICS, 1966, 37 (04) : 1928 - &