This paper presents an interdigital capacitor (IDC)-based high sensitivitymicrowave sensor for themultidimensional (complex permittivity and thickness) characterization of solidmaterials. The proposedsensorwas implemented by etching a slot resonator with an IDC on the ground layer of 0.76 mm-thick RF-35 substrate with relative permittivity of 3.5 and loss tangent of 0.0018. The IDC fingerswere configured as a spur-line structure to create an intense electric field zone that interacted significantly with the material under test (MUT), resulting in high sensitivity. A sensor prototype with optimized dimensions generated dual resonant frequencies of 2.35 GHz and 5.79 GHz and was used tomeasure the MUT's complex permittivity and thickness, respectively. Experimental results revealed that the resonant frequencies of the developed sensor exhibited high sensitivities (276 MHz/epsilon r for permittivity and 143 MHz/mm for thickness) and resolutions (0.27678 for permittivity and 0.1439 for thickness) of solid materials. Moreover, the sensing accuracies were 99.9% for real permittivity and 97.7% for imaginary permittivity. The demonstrated high performance of the developed sensor validates its applications in the multidimensional characterization of various solid materials.