Software defect prediction based on nested-stacking and heterogeneous feature selection

被引:33
作者
Chen, Li-qiong [1 ]
Wang, Can [1 ]
Song, Shi-long [1 ]
机构
[1] Shanghai Inst Technol, Shanghai, Peoples R China
关键词
Software defect prediction; Ensemble learning; Stacking; Feature select; MLP;
D O I
10.1007/s40747-022-00676-y
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Software testing guarantees the delivery of high-quality software products, and software defect prediction (SDP) has become an important part of software testing. Software defect prediction is divided into traditional software defect prediction and just-in-time software defect prediction (JIT-SDP). However, most of the existing software defect prediction frameworks are relatively simplified, which makes it extremely difficult to provide developers with more detailed reference information. To improve the effectiveness of software defect prediction and realize effective software testing resource allocation, this paper proposes a software defect prediction framework based on Nested-Stacking and heterogeneous feature selection. The framework includes three stages: data set preprocessing and feature selection, Nested-Stacking classifier, and model classification performance evaluation. The novel heterogeneous feature selection and nested custom classifiers in the framework can effectively improve the accuracy of software defect prediction. This paper conducts experiments on two software defect data sets (Kamei, PROMISE), and demonstrates the classification performance of the model through two comprehensive evaluation indicators, AUC, and F1-score. The experiment carried out large-scale within-project defect prediction (WPDP) and cross-project defect prediction (CPDP). The results show that the framework proposed in this paper has an excellent classification performance on the two types of software defect data sets, and has been greatly improved compared with the baseline models.
引用
收藏
页码:3333 / 3348
页数:16
相关论文
共 38 条
[1]   Software Defect Prediction Using Heterogeneous Ensemble Classification Based on Segmented Patterns [J].
Alsawalqah, Hamad ;
Hijazi, Neveen ;
Eshtay, Mohammed ;
Faris, Hossam ;
Al Radaideh, Ahmed ;
Aljarah, Ibrahim ;
Alshamaileh, Yazan .
APPLIED SCIENCES-BASEL, 2020, 10 (05)
[2]  
Balogun A.O., 2019, INT J SUPPLY CHAIN M, V8, P916
[3]   Performance Analysis of Feature Selection Methods in Software Defect Prediction: A Search Method Approach [J].
Balogun, Abdullateef Oluwagbemiga ;
Basri, Shuib ;
Abdulkadir, Said Jadid ;
Hashim, Ahmad Sobri .
APPLIED SCIENCES-BASEL, 2019, 9 (13)
[4]   A Novel Feature Selection Method Based on Maximum Likelihood Logistic Regression for Imbalanced Learning in Software Defect Prediction [J].
Bashir, Kamal ;
Li, Tianrui ;
Yahaya, Mahama .
INTERNATIONAL ARAB JOURNAL OF INFORMATION TECHNOLOGY, 2020, 17 (05) :721-730
[5]   SMOTEFRIS-INFFC: Handling the challenge of borderline and noisy examples in imbalanced learning for software defect prediction [J].
Bashir, Kamal ;
Li, Tianrui ;
Yohannese, Chubato Wondaferaw ;
Yahaya, Mahama .
JOURNAL OF INTELLIGENT & FUZZY SYSTEMS, 2020, 38 (01) :917-933
[6]   Class Imbalance Reduction (CIR): A Novel Approach to Software Defect Prediction in the Presence of Class Imbalance [J].
Bejjanki, Kiran Kumar ;
Gyani, Jayadev ;
Gugulothu, Narsimha .
SYMMETRY-BASEL, 2020, 12 (03)
[7]   CONTROLLING THE FALSE DISCOVERY RATE - A PRACTICAL AND POWERFUL APPROACH TO MULTIPLE TESTING [J].
BENJAMINI, Y ;
HOCHBERG, Y .
JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES B-STATISTICAL METHODOLOGY, 1995, 57 (01) :289-300
[8]   Software defect prediction: do different classifiers find the same defects? [J].
Bowes, David ;
Hall, Tracy ;
Petric, Jean .
SOFTWARE QUALITY JOURNAL, 2018, 26 (02) :525-552
[9]   Functional relations and Spearman correlation between consistency indices [J].
Cavallo, Bice .
JOURNAL OF THE OPERATIONAL RESEARCH SOCIETY, 2020, 71 (02) :301-311
[10]   Software Visualization and Deep Transfer Learning for Effective Software Defect Prediction [J].
Chen, Jinyin ;
Hu, Keke ;
Yu, Yue ;
Chen, Zhuangzhi ;
Xuan, Qi ;
Liu, Yi ;
Filkov, Vladimir .
2020 ACM/IEEE 42ND INTERNATIONAL CONFERENCE ON SOFTWARE ENGINEERING (ICSE 2020), 2020, :578-589