Detecting Laser Fault Injection Attacks via Time-to-Digital Converter Sensors

被引:7
作者
Ebrahimabadi, Mohammad [1 ]
Mehjabin, Suhee Sanjana [1 ]
Viera, Raphael [2 ]
Guilley, Sylvain [3 ,4 ]
Danger, Jean-Luc [3 ,4 ]
Dutertre, Jean-Max [2 ]
Karimi, Naghmeh [1 ]
机构
[1] Univ Maryland Baltimore Cty, Baltimore, MD 21228 USA
[2] CEA, Mines St Etienne, Leti, Ctr CMP, F-13541 Gardanne, France
[3] Inst Polytech Paris, Telecom Paris, Paris, France
[4] Secure IC SAS, Paris, France
来源
2022 IEEE INTERNATIONAL SYMPOSIUM ON HARDWARE ORIENTED SECURITY AND TRUST (HOST) | 2022年
关键词
D O I
10.1109/HOST54066.2022.9840318
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Fault Injection Attacks (FIA) have received a lot of attention in recent years. An adversary launches such an attack to abusively take control over the system or to leak sensitive data. Laser illumination has been considered as an effective technique to launch HA. The laser-based Flits are mainly used when the adversary opts to target a specific location in the target circuit. However, thanks to the miniaturization of transistors and moving towards smaller feature size, even small laser spots may illuminate more than one gate; making the attack more detectable when the circuitries are equipped with embedded fault detection mechanisms such as digital sensors. In this paper, we use timeto-digital convertors, aka digital sensors, to detect the laser shots. We show that by embedding these digital sensors in the target circuitry, the IR drop caused by the laser illumination can be sensed with a high accuracy. An alarm will be raised when the fault is detected. The simulation results show the high accuracy of the proposed scheme in detecting laser-based Mts.
引用
收藏
页码:97 / 100
页数:4
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