On solving the orientation gradient dependency of high angular resolution EBSD

被引：55

作者：

Maurice, Claire ^{[1
]}

Driver, Julian H. ^{[1
]}

Fortunier, Roland ^{[2
]}

机构：

[1] Ecole Mines St Etienne, CNRS, UMR LCG 5146, F-42023 St Etienne, France

[2] Univ Lyon, CNRS, UMR LTDS 5513, ENISE, F-42100 St Etienne, France

来源：

ULTRAMICROSCOPY | 2012年 / 113卷

关键词：

Scanning electron microscopy; Electron backscatter diffraction; Strain; Cross-correlation; Orientation gradients; Plastic deformation; ELECTRON BACKSCATTER DIFFRACTION; ELASTIC STRAIN-MEASUREMENT; BACK-SCATTER DIFFRACTION; SIMULATIONS; PATTERNS; ACCURACY; BEHAVIOR;

D O I：

10.1016/j.ultramic.2011.10.013

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Current high angular resolution electron backscatter diffraction (HR-EBSD) methods are successful at measuring pure elastic strains but have difficulties with plastically deformed metals containing orientation gradients. The strong influences of these rotations have been systematically studied using simulated patterns based on the many-beam dynamic theory of EBSP formation; a rotation of only 1 can lead to apparent elastic strains of several hundred microstrains. A new method is proposed to correct for orientation gradient effects using a two-step procedure integrating finite strain theory: (i) reference pattern rotation and (ii) cross-correlation; it reduces the strain errors on the simulated patterns to tens of microstrains. An application to plastically deformed ferritic steel to generates elastic strain maps with significantly reduced values of both strains and residual errors in regions of rotations exceeding 1 degrees. (C) 2011 Elsevier B.V. All rights reserved.

引用

页码：171 / 181

页数：11

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