Survey of Lockstep based Mitigation Techniques for Soft Errors in Embedded Systems

被引:0
作者
Wachter, Eduardo Weber [1 ]
Kasap, Server [1 ]
Zhai, Xiaojun [1 ]
Ehsan, Shoaib [1 ]
McDonald-Maier, Klaus [1 ]
机构
[1] Univ Essex, Sch Comp Sci & Elect Engn, Colchester, Essex, England
来源
2019 11TH COMPUTER SCIENCE AND ELECTRONIC ENGINEERING (CEEC) | 2019年
基金
英国工程与自然科学研究理事会;
关键词
Lockstep; Reliability; Fault Tolerance; soft error mitigation; radiation effects; ARCHITECTURE; COMPUTER;
D O I
10.1109/ceec47804.2019.8974333
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Soft errors are one of the significant design technology challenges at smaller technology nodes and especially in radiation enviro nments. This paper presents a particular class of approaches to provide reliability against radiation-induced soft errors. The paper provides a review of the lockstep mechanism across different levels of design abstraction: processor design, architectural level, and the software level. This work explores techniques providing modifications in the processor pipeline, techniques allied with FPGA dynamic reconfiguration strategies and different types of spatial redundancy.
引用
收藏
页码:124 / 127
页数:4
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