Verifying entanglement in the Hong-Ou-Mandel dip

被引:13
作者
Ray, Megan R. [1 ]
van Enk, S. J. [1 ]
机构
[1] Univ Oregon, Dept Phys, Oregon Ctr Opt, Eugene, OR 97403 USA
来源
PHYSICAL REVIEW A | 2011年 / 83卷 / 04期
基金
美国国家科学基金会;
关键词
D O I
10.1103/PhysRevA.83.042318
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The Hong-Ou-Mandel interference dip is caused by an entangled state, a delocalized biphoton state. We propose a method of detecting this entanglement by utilizing inverse Hong-Ou-Mandel interference, while taking into account vacuum and multiphoton contaminations, phase noise, and other imperfections. The method uses just linear optics and photodetectors, and for single-mode photodetectors we find a lower bound on the amount of entanglement.
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页数:5
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