Multilayer EUV/x-ray polychromators for plasma diagnostics

被引：6

作者：

Shmaenok, LA

Platonov, YY

Salashchenko, NN

Sorokin, AA

Simanovskii, DM

Golubev, AV

Belik, VP

Bobashev, SV

Bijkerk, F

Louis, E

Meijer, FG

Etlicher, B

Grudsky, AY

机构：

[1] INST PHYS MICROSTRUCT,NIZHNII NOVGOROD 603600,RUSSIA

[2] EURATOM ASSOC,FOM,INST PLASMA PHYS,NL-3439 MN NIEUWEGEIN,NETHERLANDS

[3] ECOLE POLYTECH,F-91128 PALAISEAU,FRANCE

[4] SEIFERT ROENTGEN & KO AO,ST PETERSBURG 195220,RUSSIA

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1996年 / 80卷

关键词：

D O I：

10.1016/0368-2048(96)02970-2

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Recent developments of multilayer polychromators for the EUV and the soft x-ray range are reported. Upgrading and optimization of multilayers and filters, and a modular design boosted applications at various plasma facilities. Results of experiments with short-pulse (laser, liner) and tokamak plasmas are presented.

引用

页码：259 / 262

页数：4

共 50 条

[11] INSTRUMENTAL DESIGN FACTORS IN X-RAY POLYCHROMATORS [J].

KEMP, JW ;

DAVIDSON, E ;

JONES, JL .

SPECTROCHIMICA ACTA, 1957, 9 (02) :171-171

[12] Multilayer optics for coherent EUV/X-ray laser sources [J].

Delmotte, F. ;

Dehlinger, M. ;

Bourassin-Bouchet, Ch. ;

de Rossi, S. ;

Jerome, A. ;

Meltchakov, E. ;

Varniere, F. .

X-RAY LASERS AND COHERENT X-RAY SOURCES: DEVELOPMENT AND APPLICATIONS XI, 2015, 9589

[13] Development and application of the x-ray/EUV calibration facility with a laser plasma source for plasma diagnostics and bio-medical x-ray microscopy. [J].

Kantsyrev, V ;

Bauer, B ;

Publicover, N ;

Fedin, D ;

Ammons, N .

X-RAY OPTICS, INSTRUMENTS, AND MISSIONS II, 1999, 3766 :252-260

[14] LASER PLASMA X-RAY DIAGNOSTICS [J].

CUDERMAN, JF ;

GLIBERT, KM ;

HOHLFELD.JJ .

BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1973, 18 (10) :1342-1342

[15] EUV and x-ray instrumentation for spectrometry, polarimetry and imaging in hot plasma diagnostics, atomic physics and x-ray microscopy: a status report. [J].

Kantsyrev, VL ;

Bauer, BS ;

Phaneuf, RA .

X-RAY AND ULTRAVIOLET SPECTROSCOPY AND POLARIMETRY II, 1998, 3443 :86-97

[16] Recent Advances in Multilayer Reflective Optics for EUV/X-Ray Sources [J].

Soufli, R. ;

Robinson, J. C. ;

Fernandez-Perea, M. ;

Spiller, E. ;

Brejnholt, N. F. ;

Descalle, M. -A. ;

Pivovaroff, M. J. ;

Gullikson, E. M. .

X-RAY LASERS 2014, 2016, 169 :331-337

[17] Polychromator five channel x-ray/EUV spectrometer with imaging transmission grating for plasma diagnostics. [J].

Fedin, D ;

Kantsyrev, V ;

Bauer, B ;

Shlyaptseva, A ;

Brytov, I .

ULTRAVIOLET AND X-RAY DETECTION, SPECTROSCOPY, AND POLARIMETRY III, 1999, 3764 :80-84

[18] Spectral tailoring of nanoscale EUV and soft x-ray multilayer optics [J].

Huang, Qiushi ;

Medvedev, Viacheslav ;

van de Kruijs, Robbert ;

Yakshin, Andrey ;

Louis, Eric ;

Bijkerk, Fred .

APPLIED PHYSICS REVIEWS, 2017, 4 (01)

[19] ADVANCES IN MULTILAYER X-RAY/EUV OPTICS - SYNTHESIS, PERFORMANCE, AND INSTRUMENTATION [J].

BARBEE, TW .

OPTICAL ENGINEERING, 1990, 29 (07) :711-720

[20] Coronal diagnostics with coordinated radio and EUV/soft X-ray observations [J].

Brosius, JW .

SOLAR AND SPACE WEATHER RADIOPHYSICS: CURRENT STATUS AND FUTURE DEVELOPMENTS, 2004, 314 :265-286

← 1 2 3 4 5 →