Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries

被引:10
作者
Klemme, Florian [1 ]
Amrouch, Hussam [1 ]
机构
[1] Univ Stuttgart, Elect Engn Fac, Dept Comp Sci, Chair Semicond Test & Reliabil STAR, D-70569 Stuttgart, Germany
关键词
Transistors; Libraries; Training; Standards; SPICE; Degradation; Aging; Machine learning; active learning; standard cell library characterization; transistor aging; VARIABILITY;
D O I
10.1109/TCSI.2022.3201431
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Machine learning (ML)-driven standard cell library characterization enables rapid, on-the-fly generation of cell libraries, opening the door for extensive design-space exploration and other, previously infeasible approaches. However, the benefits of ML-based cell library characterization are strongly limited by its high demand in training data and the costly SPICE simulation required to generate the training samples. Therefore, efficient learning strategies are needed to minimize the required training data for ML models while still sustaining high prediction accuracy. In this work, we explore multiple active and passive learning strategies for ML-based cell library characterization with focus on aging-induced degradation. While random sampling and greedy sampling strategies operate with low computational overhead, active learning considers the performance of ML models to find the most valuable samples for training. We also introduce a hybrid approach of active learning and greedy sampling to optimize the trade-off between reduction in training samples and computational overhead. Our experiments demonstrate an achievable training data reduction of up to 77 % compared to the state of the art, depending on the targeted accuracy of the ML models.
引用
收藏
页码:5233 / 5246
页数:14
相关论文
共 26 条
  • [11] Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency
    Klemme, Florian
    Amrouch, Hussam
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2022, 69 (05) : 2142 - 2155
  • [12] Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization
    Klemme, Florian
    Amrouch, Hussam
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2021, 68 (06) : 2569 - 2579
  • [13] Cell Library Characterization using Machine Learning for Design Technology Co-Optimization
    Klemme, Florian
    Chauhan, Yogesh
    Henkel, Joerg
    Amrouch, Hussam
    [J]. 2020 IEEE/ACM INTERNATIONAL CONFERENCE ON COMPUTER AIDED-DESIGN (ICCAD), 2020,
  • [14] Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates
    Kukner, Halil
    Khan, Seyab
    Weckx, Pieter
    Raghavan, Praveen
    Hamdioui, Said
    Kaczer, Ben
    Catthoor, Francky
    Van der Perre, Liesbet
    Lauwereins, Rudy
    Groeseneken, Guido
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2014, 14 (01) : 182 - 193
  • [15] Mintarno E, 2013, INT RELIAB PHY SYM
  • [16] Natarajan S., 2014, 2014 IEEE International Electron Devices Meeting (IEDM), DOI 10.1109/IEDM.2014.7046976
  • [17] Pedregosa F, 2011, J MACH LEARN RES, V12, P2825
  • [18] PULP Platform, 2022, REGR TESTS
  • [19] Schutze H., 2006, P 15 ACM INT C INFOR, P662
  • [20] Settles B., 2012, ACTIVE LEARNING, DOI DOI 10.2200/S00429ED1V01Y201207AIM018