Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries

被引:10
作者
Klemme, Florian [1 ]
Amrouch, Hussam [1 ]
机构
[1] Univ Stuttgart, Elect Engn Fac, Dept Comp Sci, Chair Semicond Test & Reliabil STAR, D-70569 Stuttgart, Germany
关键词
Transistors; Libraries; Training; Standards; SPICE; Degradation; Aging; Machine learning; active learning; standard cell library characterization; transistor aging; VARIABILITY;
D O I
10.1109/TCSI.2022.3201431
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Machine learning (ML)-driven standard cell library characterization enables rapid, on-the-fly generation of cell libraries, opening the door for extensive design-space exploration and other, previously infeasible approaches. However, the benefits of ML-based cell library characterization are strongly limited by its high demand in training data and the costly SPICE simulation required to generate the training samples. Therefore, efficient learning strategies are needed to minimize the required training data for ML models while still sustaining high prediction accuracy. In this work, we explore multiple active and passive learning strategies for ML-based cell library characterization with focus on aging-induced degradation. While random sampling and greedy sampling strategies operate with low computational overhead, active learning considers the performance of ML models to find the most valuable samples for training. We also introduce a hybrid approach of active learning and greedy sampling to optimize the trade-off between reduction in training samples and computational overhead. Our experiments demonstrate an achievable training data reduction of up to 77 % compared to the state of the art, depending on the targeted accuracy of the ML models.
引用
收藏
页码:5233 / 5246
页数:14
相关论文
共 26 条
  • [1] Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology
    Amrouch, Hussam
    Pahwa, Girish
    Gaidhane, Amol D.
    Dabhi, Chetan K.
    Klemme, Florian
    Prakash, Om
    Chauhan, Yogesh Singh
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 67 (09) : 3127 - 3137
  • [2] [Anonymous], 2022, PRIM HSPIC US GUID
  • [3] [Anonymous], PRIM US GUID, P2022
  • [4] Designing reliable systems from unreliable components: The challenges of transistor variability and degradation
    Borkar, S
    [J]. IEEE MICRO, 2005, 25 (06) : 10 - 16
  • [5] Bujrbidge R, 2007, LECT NOTES COMPUT SC, V4881, P209
  • [6] PULP: A Ultra-Low Power Parallel Accelerator for Energy-Efficient and Flexible Embedded Vision
    Conti, Francesco
    Rossi, Davide
    Pullini, Antonio
    Loi, Igor
    Benini, Luca
    [J]. JOURNAL OF SIGNAL PROCESSING SYSTEMS FOR SIGNAL IMAGE AND VIDEO TECHNOLOGY, 2016, 84 (03): : 339 - 354
  • [7] Danka T., 2018, ARXIV
  • [8] Machine Learning for Electronic Design Automation: A Survey
    Huang, Guyue
    Hu, Jingbo
    He, Yifan
    Liu, Jialong
    Ma, Mingyuan
    Shen, Zhaoyang
    Wu, Juejian
    Xu, Yuanfan
    Zhang, Hengrui
    Zhong, Kai
    Ning, Xuefei
    Ma, Yuzhe
    Yang, Haoyu
    Yu, Bei
    Yang, Huazhong
    Wang, Yu
    [J]. ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2021, 26 (05)
  • [9] Hwanjo Yu, 2010, Proceedings 2010 10th IEEE International Conference on Data Mining (ICDM 2010), P1151, DOI 10.1109/ICDM.2010.9
  • [10] Machine Learning for Circuit Aging Estimation under Workload Dependency
    Klemme, Florian
    Amrouch, Hussam
    [J]. 2021 IEEE INTERNATIONAL TEST CONFERENCE (ITC 2021), 2021, : 37 - 46