Cross-project smell-based defect prediction

被引:11
|
作者
Sotto-Mayor, Bruno [1 ]
Kalech, Meir [1 ]
机构
[1] Ben Gurion Univ Negev, Beer Sheva, Israel
关键词
Cross-project defect prediction; Defect prediction; Code smell; Mining software repositories; Software quality; Software engineering; CODE; METRICS;
D O I
10.1007/s00500-021-06254-7
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Defect prediction is a technique introduced to optimize the testing phase of the software development pipeline by predicting which components in the software may contain defects. Its methodology trains a classifier with data regarding a set of features measured on each component from the target software project to predict whether the component may be defective or not. However, suppose the defective information is not available in the training set. In that case, we need to rely on an alternate approach that uses the training set of external projects to train the classifier. This approached is called cross-project defect prediction. Bad code smells are a category of features that have been previously explored in defect prediction and have been shown to be a good predictor of defects. Code smells are patterns of poor development in the code and indicate flaws in its design and implementation. Although they have been previously studied in the context of defect prediction, they have not been studied as features for cross-project defect prediction. In our experiment, we train defect prediction models for 100 projects to evaluate the predictive performance of the bad code smells. We implemented four cross-project approaches known in the literature and compared the performance of 37 smells with 56 code metrics, commonly used for defect prediction. The results show that the cross-project defect prediction models trained with code smells significantly improved 6.50% on the ROC AUC compared against the code metrics.
引用
收藏
页码:14171 / 14181
页数:11
相关论文
共 50 条
  • [41] Improving Relevancy Filter Methods for Cross-Project Defect Prediction
    Kawata, Kazuya
    Amasaki, Sousuke
    Yokogawa, Tomoyuki
    APPLIED COMPUTING & INFORMATION TECHNOLOGY, 2016, 619 : 1 - 12
  • [42] Improving transfer learning for software cross-project defect prediction
    Omondiagbe, Osayande P.
    Licorish, Sherlock A.
    Macdonell, Stephen G.
    APPLIED INTELLIGENCE, 2024, 54 (07) : 5593 - 5616
  • [43] A Cluster Based Feature Selection Method for Cross-Project Software Defect Prediction
    Ni, Chao
    Liu, Wang-Shu
    Chen, Xiang
    Gu, Qing
    Chen, Dao-Xu
    Huang, Qi-Guo
    JOURNAL OF COMPUTER SCIENCE AND TECHNOLOGY, 2017, 32 (06) : 1090 - 1107
  • [44] Transfer Convolutional Neural Network for Cross-Project Defect Prediction
    Qiu, Shaojian
    Xu, Hao
    Deng, Jiehan
    Jiang, Siyu
    Lu, Lu
    APPLIED SCIENCES-BASEL, 2019, 9 (13):
  • [45] HYDRA: Massively Compositional Model for Cross-Project Defect Prediction
    Xia, Xin
    Lo, David
    Pan, Sinno Jialin
    Nagappan, Nachiappan
    Wang, Xinyu
    IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 2016, 42 (10) : 977 - 998
  • [46] Cross-Version Defect Prediction using Cross-Project Defect Prediction Approaches: Does it work?
    Amasaki, Sousuke
    PROMISE'18: PROCEEDINGS OF THE 14TH INTERNATIONAL CONFERENCE ON PREDICTIVE MODELS AND DATA ANALYTICS IN SOFTWARE ENGINEERING, 2018, : 32 - 41
  • [47] Cross-project defect prediction via semantic and syntactic encoding
    Jiang, Siyu
    Chen, Yuwen
    He, Zhenhang
    Shang, Yunpeng
    Ma, Le
    EMPIRICAL SOFTWARE ENGINEERING, 2024, 29 (04)
  • [48] Cross-project Defect Prediction Method Using Adversarial Learning
    Xing Y.
    Qian X.-M.
    Guan Y.
    Zhang S.-H.
    Zhao M.-C.
    Lin W.-T.
    Ruan Jian Xue Bao/Journal of Software, 2022, 33 (06): : 2097 - 2112
  • [49] Manifold embedded distribution adaptation for cross-project defect prediction
    Sun, Ying
    Jing, Xiao-Yuan
    Wu, Fei
    Sun, Yanfei
    IET SOFTWARE, 2020, 14 (07) : 825 - 838
  • [50] An Empirical Study of Classifier Combination for Cross-Project Defect Prediction
    Zhang, Yun
    Lo, David
    Xia, Xin
    Sun, Jianling
    39TH ANNUAL IEEE COMPUTERS, SOFTWARE AND APPLICATIONS CONFERENCE (COMPSAC 2015), VOL 2, 2015, : 264 - 269