Multi-layer far-infrared component technology

被引:0
作者
Peale, Robert E. [1 ]
Cleary, Justin W. [1 ]
Buchwald, Walter R. [2 ]
Davis, Andrew [2 ]
Wentzell, Sandy [2 ]
Stacy, Bill [2 ]
Edwards, Oliver [3 ]
机构
[1] Univ Cent Florida, Dept Phys, Orlando, FL 32765 USA
[2] US Air Force, Res Lab, Sensors Directorate, Hanscom AFB, MA 01731 USA
[3] Zyberwear Inc, Ocoee, FL 34761 USA
来源
NANOPHOTONICS AND MACROPHOTONICS FOR SPACE ENVIRONMENTS IV | 2010年 / 7817卷
关键词
Far-infrared; Bragg mirror; thin-film optics; Terahertz; silicon; FABRY-PEROT-INTERFEROMETER; FILTER;
D O I
10.1117/12.861598
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
Multi-layer thin-film optics based on alternating sub-wavelength layers of silicon and air provide high index contrast to create improved components with just a few layers. Applications include ultra-high reflectivity mirrors, band-pass and band-blocking filters, anti-reflection coatings, and compact high-resolution Fabry-Perot spectrometers with broad free-spectral-range. Such components may be integrated directly into airborne/satellite and man-portable sensing instrumentation. We demonstrate a process to produce ultrathin silicon optical elements with an integral raised spacer rim to provide the requisite air gap when these elements are combined directly into a Bragg stack. Laboratory measurements confirm theoretical design specifications. Individual elements may be stacked and bonded to form Bragg mirrors and other thin-film optics.
引用
收藏
页数:9
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