Reconstruction method for grating-based X-ray phase tomographic microscope

Phase imaging has a higher sensitivity for low-Z materials than the conventional absorption imaging. We have developed a high-resolution X-ray phase microscope in combination with a Lau interferometer and used it for phase tomography. However, the existing method cannot avoid artifacts originating from the assumption of a two-beam interference model. In this study, we use a three-wave interference model to reduce the artifacts and propose a new method to attain phase tomography. In the presentation, we will demonstrate the reduction of the artifacts with the results of phase tomography.