Beamline electrostatic levitator for in situ high energy x-ray diffraction studies of levitated solids and liquids -: art. no. 073901

被引:70
作者
Gangopadhyay, AK [1 ]
Lee, GW
Kelton, KF
Rogers, JR
Goldman, AI
Robinson, DS
Rathz, TJ
Hyers, RW
机构
[1] Washington Univ, Dept Phys, St Louis, MO 63130 USA
[2] NASA, George C Marshall Space Flight Ctr, Huntsville, AL 35812 USA
[3] US DOE, Ames Lab, Ames, IA 50011 USA
[4] Iowa State Univ, Ames, IA 50011 USA
[5] Univ Alabama, Huntsville, AL 35801 USA
[6] Univ Massachusetts, Amherst, MA 01003 USA
基金
美国国家航空航天局;
关键词
D O I
10.1063/1.1932447
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Determinations of the phase formation sequence, crystal structures and the thermo-physical properties of materials at high temperatures are hampered by contamination from the sample container and environment. Containerless processing techniques, such as electrostatic (ESL), electromagnetic, aerodynamic, and acoustic levitation, are most suitable for these studies. An adaptation of ESL for in situ structural studies of a wide range of materials using high energy (30-130 keV) x rays at a synchrotron source is described here. This beamline ESL (BESL) allows the in situ determination of the atomic structures of equilibrium solid and liquid phases, undercooled liquids and time-resolved studies of solid-solid and liquid-solid phase transformations. The use of area detectors enables the rapid acquisition of complete diffraction patterns over a wide range (0.5-14 A(-1)) of reciprocal space. The wide temperature range (300-2500 K), containerless processing environment under high vacuum (10(-7)-10(-8) Torr), and fast data acquisition capability, make BESL particularly well suited for phase stability studies of high temperature solids and liquids. An additional, but important, feature of BESL is the capability for simultaneous measurements of a host of thermo-physical properties including the specific heat, enthalpy of transformation, solidus and liquidus temperatures, density, viscosity, and surface tension, all on the same sample during the structural measurements. (c) 2005 American Institute of Physics.
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页数:6
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