Latest developments for microstructural and chemical characterization of diffusion bonding in superplastic 8090 Al-Li alloys

被引：5

作者：

Urena, A

deSalazar, JMG

Martin, JJ

Quinones, J

机构：

[1] Depto. Cie. los Mat. Ing. M., Facultad de Ciencias Químicas, Universidad Complutense de Madrid

来源：

JOURNAL OF MATERIALS RESEARCH | 1996年 / 11卷 / 01期

关键词：

D O I：

10.1557/JMR.1996.0009

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This paper describes a new application of two complementary surface characterization techniques to study solid-state bonding in an Al-Li alloy. Through the two mentioned techniques, Atomic Force Microscopy (AFM) and Secondary Ion Mass Spectrometry (SIMS), important findings about what takes place in the bond interface have been determined. These findings enclose both the formation of discontinuous mixed oxides and the evolution of Li through the bond line and into the adjacent diffusion affected zones. Homogenization of Li and Cu alloy elements has been detected even in those cases where a metallic interlayer was used to favor the union.

引用

页码：63 / 71

页数：9

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