Characteristics of green light-emitting diodes using an InGaN:Mg/GaN:Mg superlattice as p-type hole injection and contact layers

被引:12
作者
Liu, J. P. [1 ,2 ]
Limb, J. B. [1 ,2 ]
Ryou, J. -H. [1 ,2 ]
Lee, W. [1 ,2 ]
Yoo, D. [1 ,2 ,3 ]
Horne, C. A. [1 ,2 ]
Dupuis, R. D. [1 ,2 ,3 ]
机构
[1] Georgia Inst Technol, Ctr Compound Semicond, Atlanta, GA 30332 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
[3] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
关键词
light-emitting diode (LED); gallium nitride (GaN); metalorganic chemical vapor deposition (MOCVD); InGaN; green LED;
D O I
10.1007/s11664-007-0355-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Mg-doped InGaN/GaN p-type short-period superlattices (SPSLs) are developed for hole injection and contact layers of green light-emitting diodes (LEDs). V-defect-related pits, which are commonly found in an InGaN bulk layer, can be eliminated in an InGaN/GaN superlattice with thickness and average composition comparable to those of the bulk InGaN layer. Mg-doped InGaN/GaN SPSLs show significantly improved electrical properties with resistivity as low as similar to 0.35 ohm-cm, which is lower than that of GaN:Mg and InGaN:Mg bulk layers grown under optimized growth conditions. Green LEDs employing Mg-doped InGaN/GaN SPSLs for hole injection and contact layers have significantly lower reverse leakage current, which is considered to be attributed to improved surface morphology. The peak electroluminescence intensity of LEDs with a SPSL is compared to that with InGaN:Mg bulk hole injection and contact layers.
引用
收藏
页码:558 / 563
页数:6
相关论文
共 15 条
[1]   Microstructural origin of leakage current in GaN/InGaN light-emitting diodes [J].
Cao, XA ;
Teetsov, JA ;
Shahedipour-Sandvik, F ;
Arthur, SD .
JOURNAL OF CRYSTAL GROWTH, 2004, 264 (1-3) :172-177
[2]   Pit formation in GaInN quantum wells [J].
Chen, Y ;
Takeuchi, T ;
Amano, H ;
Akasaki, I ;
Yamano, N ;
Kaneko, Y ;
Wang, SY .
APPLIED PHYSICS LETTERS, 1998, 72 (06) :710-712
[3]   Interdiffusion of In and Ga in InGaN/GaN multiple quantum wells [J].
Chuo, CC ;
Lee, CM ;
Chyi, JI .
APPLIED PHYSICS LETTERS, 2001, 78 (03) :314-316
[4]   Formation of V-shaped pits in InGaN/GaN multiquantum wells and bulk InGaN films [J].
Kim, IH ;
Park, HS ;
Park, YJ ;
Kim, T .
APPLIED PHYSICS LETTERS, 1998, 73 (12) :1634-1636
[5]  
KRAMES M, 2003, 2003 DOE SOL STAT LI
[6]   Influence of growth temperature and growth rate of p-GaN layers on the characteristics of green light emitting diodes [J].
Lee, W ;
Limb, J ;
Ryou, JH ;
Yoo, D ;
Chung, T ;
Dupuis, RD .
JOURNAL OF ELECTRONIC MATERIALS, 2006, 35 (04) :587-591
[7]   Effect of thermal annealing induced by p-type layer growth on blue and green LED performance [J].
Lee, W ;
Limb, J ;
Ryou, JH ;
Yoo, D ;
Chung, T ;
Dupuis, RD .
JOURNAL OF CRYSTAL GROWTH, 2006, 287 (02) :577-581
[8]   Nitride-based green light-emitting diodes with various p-type layers [J].
Lee, Wonseok ;
Limb, Jae ;
Ryou, Jae-Hyun ;
Yoo, Dongwon ;
Ewing, Mark Andrew ;
Korenblit, Yair ;
Dupuis, Russell D. .
JOURNAL OF DISPLAY TECHNOLOGY, 2007, 3 (02) :126-132
[9]   Comparison of GaN and In0.04Ga0.96N p-layers on the electrical and electroluminescence properties of green light emitting diodes [J].
Limb, J. B. ;
Lee, W. ;
Ryou, J.-H. ;
Yoo, D. ;
Dupuis, R. D. .
JOURNAL OF ELECTRONIC MATERIALS, 2007, 36 (04) :426-430
[10]   Investigations on V-defects in quaternary AlInGaN epilayers [J].
Liu, JP ;
Wang, YT ;
Yang, H ;
Jiang, DS ;
Jahn, U ;
Ploog, KH .
APPLIED PHYSICS LETTERS, 2004, 84 (26) :5449-5451