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Adjustment of thermal hysteresis in epitaxial VO2 films by doping metal ions
被引:23
作者:
Nishikawa, Masami
[2
]
Nakajima, Tomohiko
[1
]
Kumagai, Toshiya
[1
]
Okutani, Takeshi
[2
]
Tsuchiya, Tetsuo
[1
]
机构:
[1] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058565, Japan
[2] Yokohama Natl Univ, Sch Environm & Informat Sci, Hodogaya Ku, Yokohama, Kanagawa 2408501, Japan
关键词:
VO2;
Epitaxial film;
Metal-insulator transition;
Hysteresis;
TCR;
THIN-FILMS;
INSULATOR-TRANSITION;
ORGANIC DEPOSITION;
VANADIUM DIOXIDE;
TEMPERATURE;
DETECTORS;
D O I:
10.2109/jcersj2.119.577
中图分类号:
TQ174 [陶瓷工业];
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Thermal hysteresises of electrical resistance, accompanying with a structural phase transition, in epitaxial VO2 films have been successfully reduced to 1 degrees C or less by doping Ti or Nb ions. We considered that owing to the metal-ion-substitutive structural defects induced by doping metal ions into VO2 films, the structural phase transition easily occurred without superheating or supercooling. In Nb-doped VO2 films, the hysteresis disappeared at a lower doping level than Ti-doped VO2 films. The maximum values of the temperature coefficient of the resistance of V0.91Ti0.09O2 and V0.982Nb0.018O2 films, which exhibited non-hysteretic MI transitions, were -24.8%/degrees C at 46 degrees C and -21.6%/degrees C at 19 degrees C, respectively. (C)2011 The Ceramic Society of Japan. All rights reserved.
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页码:577 / 580
页数:4
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