Single Event Effect Testing of Commercial Off-The-Shelf Components

被引：0

作者：

Riaz, M. Hammad ^{[1
]}

Javed, A. ^{[1
]}

Ahsan, M. ^{[1
]}

机构：

[1] SUPARCO, Anal & Ruggedizat Grp, Lahore 54000, Pakistan

来源：

2015 FOURTH INTERNATIONAL CONFERENCE ON AEROSPACE SCIENCE AND ENGINEERING (ICASE) | 2016年

关键词：

Single Event Effect(SEE); proton irradiation; heavy ion irradiation; SRIM/TRIM; Commercial Off-The-Shelf Components;

D O I：

暂无

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

This paper investigates the effects of space radiations on Commercial Off-The-Shelf (COTS) components. The qualified COTS components replace the expensive space grade components. The COTS components are cost effective and give access to cutting edge technologies. The Single Event Effect (SEE) analysis was done on COTS memories and microcontrollers using proton and nickel ion sources accelerated by 5MV tandem accelerator. The effects of radiations are also investigated and simulated by SRIM/TRIM. The devices were tested and qualified upto the LET of 21 MeV/cm(2)/mg:

引用

页数：4