Advanced X-ray imaging at beamline 07 of the SAGA Light Source

被引:10
|
作者
Yoneyama, Akio [1 ,2 ,3 ]
Takeya, Satoshi [4 ]
Lwin, Thet Thet [2 ]
Takamatsu, Daiko [3 ]
Baba, Rika [3 ]
Konishi, Kumiko [3 ]
Fujita, Ryusei [3 ]
Kobayashi, Keisuke [3 ]
Shima, Akio [3 ]
Kawamoto, Masahide [1 ]
Setoyama, Hiroyuki [1 ]
Ishiji, Kotaro [1 ]
Seno, Yoshiki [1 ]
机构
[1] SAGA Light Source, Beamline Grp, 8-7 Yayoigaoka, Tosu, Saga 8410005, Japan
[2] Kitasato Univ, Allied Hlth Sci, Minami Ku, 1-15-1 Kitasato, Sagamihara, Kanagawa 2520373, Japan
[3] Hitachi Ltd, Res & Dev Grp, 1-280 Higashi Koigakubo, Kokubunji, Tokyo 1858601, Japan
[4] Natl Inst Adv Ind Sci & Technol, Natl Metrol Inst Japan, Cent 5,1-1-1 Higashi, Tsukuba, Ibaraki 3058565, Japan
关键词
micro-CT; phase-contrast CT; low-temperature CT; time-resolved topography; Ge double-crystal monochromator; operando topography; QUANTITATIVE-ANALYSIS; COMPUTED-TOMOGRAPHY; PHASE RETRIEVAL; NATURAL-GAS; CONTRAST; DIFFRACTION; INTERFEROMETER; HYDRATE;
D O I
10.1107/S1600577521009553
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The SAGA Light Source provides X-ray imaging resources based on high-intensity synchrotron radiation (SR) emitted from the superconducting wiggler at beamline 07 (BL07). By combining quasi-monochromatic SR obtained by the newly installed water-cooled metal filter and monochromatic SR selected by a Ge double-crystal monochromator (DCM) with high-resolution lens-coupled X-ray imagers, fast and low-dose micro-computed tomography (CT), fast phase-contrast CT using grating-based X-ray interferometry, and 2D micro-X-ray absorption fine structure analysis can be performed. In addition, by combining monochromatic SR obtained by a Si DCM with large-area fiber-coupled X-ray imagers, high-sensitivity phase-contrast CT using crystal-based X-ray interferometry can be performed. Low-temperature CT can be performed using the newly installed cryogenic system, and time-resolved analysis of the crystallinity of semiconductor devices in operation can be performed using a time-resolved topography system. The details of each instrument and imaging method, together with exemplary measurements, are presented.
引用
收藏
页码:1966 / 1977
页数:12
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