Refraction driven X-ray caustics at curved interfaces

被引:18
作者
Evsevleev, S. [1 ]
Mueller, B. R. [1 ]
Lange, A. [1 ]
Kupsch, A. [1 ]
机构
[1] BAM Bundesanstalt Mat Forsch & Prufung, Unter Eichen 87, D-12205 Berlin, Germany
关键词
X-ray caustics; X-ray refraction; Irradiation; Sterilization; Cross-linking; Radiation shielding; PHASE TOMOGRAPHY; CONTRAST; RADIATION; RETRIEVAL; FIELD;
D O I
10.1016/j.nima.2018.10.152
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
X-ray refraction related interaction has received rising interest since about two decades in the field of imaging, beam shaping and analysis although being discovered a century ago. Due to refraction at interfaces in inhomogeneous media X-rays undergo natural focusing (or defocusing) of waves, revealing caustics. Such kind of intensity patterns are well-known for visible light, but have been sparsely discussed for X-rays. The variation of irradiation density may be predicted in case of known shapes. Analogously to light optics, the intensity distributions cover several orders of magnitude including complete extinction. The partly convergent (and divergent) caustic stripes originate from narrow zones of typical size of some 10(-6) of the boundary curvature radius. For the deflection of plane wave synchrotron radiation (energy in the range of some keV to some ten keV) at rods and tubes of several mu m diameter, we find good agreement between experiments and modeling by ray tracing according to Snell's law without additional diffraction contributions. Apart from basic research implications, caustics may influence the performance of irradiation technologies such as sterilization or molecular cross-linking.
引用
收藏
页码:275 / 282
页数:8
相关论文
共 24 条
[1]   Simple X-ray dark- and bright-field imaging using achromatic lane optics [J].
Ando, M ;
Maksimenko, A ;
Sugiyama, H ;
Pattanasiriwisawa, W ;
Hyodo, K ;
Uyama, C .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2002, 41 (9A-B) :L1016-L1018
[2]   Diffraction enhanced x-ray imaging [J].
Chapman, D ;
Thomlinson, W ;
Johnston, RE ;
Washburn, D ;
Pisano, E ;
Gmur, N ;
Zhong, Z ;
Menk, R ;
Arfelli, F ;
Sayers, D .
PHYSICS IN MEDICINE AND BIOLOGY, 1997, 42 (11) :2015-2025
[3]   Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays [J].
Cloetens, P ;
Ludwig, W ;
Baruchel, J ;
Van Dyck, D ;
Van Landuyt, J ;
Guigay, JP ;
Schlenker, M .
APPLIED PHYSICS LETTERS, 1999, 75 (19) :2912-2914
[4]   PHASE-CONTRAST IMAGING OF WEAKLY ABSORBING MATERIALS USING HARD X-RAYS [J].
DAVIS, TJ ;
GAO, D ;
GUREYEV, TE ;
STEVENSON, AW ;
WILKINS, SW .
NATURE, 1995, 373 (6515) :595-598
[5]   SMALL-ANGLE X-RAY REFRACTION IN METAL WIRES, GLASS-FIBERS AND HARD ELASTIC PROPYLENES [J].
HENTSCHEL, MP ;
HOSEMANN, R ;
LANGE, A ;
UTHER, B ;
BRUCKNER, R .
ACTA CRYSTALLOGRAPHICA SECTION A, 1987, 43 :506-513
[6]   NONDESTRUCTIVE EVALUATION OF SINGLE-FIBER DEBONDING IN COMPOSITES BY X-RAY REFRACTION [J].
HENTSCHEL, MP ;
HARBICH, KW ;
LANGE, A .
NDT & E INTERNATIONAL, 1994, 27 (05) :275-280
[7]   Refraction contrast in X-ray imaging [J].
Keyriläinen, J ;
Fernández, M ;
Suortti, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2002, 488 (1-2) :419-427
[8]   Microstructure characterisation of ceramics via 2D and 3D X-ray refraction techniques [J].
Kupsch, Andreas ;
Mueller, Bernd R. ;
Lange, Axel ;
Bruno, Giovanni .
JOURNAL OF THE EUROPEAN CERAMIC SOCIETY, 2017, 37 (05) :1879-1889
[9]  
Lange A., 2012, 18 WORLD C NOND TEST
[10]   Numerical correction of X-ray detector backlighting [J].
Lange, Axel ;
Hentschel, Manfred P. ;
Kupsch, Andreas ;
Mueller, Bernd R. .
INTERNATIONAL JOURNAL OF MATERIALS RESEARCH, 2012, 103 (02) :174-178