The preparation and the measurement of thick film lead zirconate titanate

被引：0
作者：
Kong Fanhua [1 ]
Xue Chenyang [1 ]
Chen Lin [1 ]
Li Junhong [1 ]
Zhang Wendong [1 ]
机构：
[1] N Univ China, Key Lab Instrumentat Sci & Dynam Measurement, Minist Educ, Taiyuan 030051, Shanxi, Peoples R China
来源：
ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS | 2007年
关键词：
lead zirconate titanate (PZT); pyroelectric; Raman; XRD; sol-gel technology; thick film technique;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Based on the thick film technology, and combining with the sol-gel technique, the pyroelectric thick film material, lead zirconate titanate (PZT), is prepared on the ceramic. Through the measurement of the topography, thickness, XRD, Raman, the performance of the film can be obtained. From the numerical value analyses of the Raman measurement, the crystal of the eight-layer film on the Pd-Ag electrode, which is sintered at 420 degrees C and annealed at 600 degrees C, is the best one among the others.
引用
收藏
页码：5040 / 5043
页数：4
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