Slip localization in Inconel 718: A three-dimensional and statistical perspective

被引：61

作者：

Charpagne, M. A. ^{[1
]}

Hestroffer, J. M. ^{[1
]}

Polonsky, A. T. ^{[1
,4
]}

Echlin, M. P. ^{[1
]}

Texier, D. ^{[2
]}

Valle, V. ^{[3
]}

Beyerlein, I. J. ^{[1
]}

Pollock, T. M. ^{[1
]}

Stinville, J. C. ^{[1
]}

机构：

[1] Univ Calif Santa Barbara, Mat Dept, Santa Barbara, CA 93106 USA

[2] Univ Toulouse, Inst Clement Ader ICA, ISAE SUPAERO, CNRS INSA UPS,Mines Albi,UMR CNRS 5312, Campus Jarlard, F-81013 Albi 09, France

[3] Univ Poitiers, Inst PPRIME, ENSMA, CNRS,UPR 3346, F-86962 Chasseneuil, France

[4] Sandia Natl Labs, Mat Mech & Tribol Dept, POB 5800, Albuquerque, NM 87185 USA

来源：

ACTA MATERIALIA | 2021年 / 215卷

基金：

美国国家科学基金会;

关键词：

Strain localization; High resolution digital image correlation; 3D EBSD; Slip bands; Crystal plasticity finite elements; FATIGUE-CRACK INITIATION; GRAIN MISORIENTATION; STRAIN LOCALIZATION; CRYSTAL PLASTICITY; TWIN BOUNDARIES; CYCLE FATIGUE; DEFORMATION; DIFFRACTION; SUPERALLOY; BEHAVIOR;

D O I：

10.1016/j.actamat.2021.117037

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The slip localization behavior of the polycrystalline nickel base superalloy Inconel 718 during monotonic tensile loading at room temperature, is investigated for the first time in relation to the 3D microstructure. Multi-modal data merging tools are used to recombine high resolution digital image correlation (HR-DIC) data with 3D electron back-scatter diffraction tomography (3D EBSD), over a wide region of interest. This procedure enables reconstruction of the slip band planes in the 3D microstructure. Statistical analyses conducted over 500 individual slip bands reveal strong correlations between their location and specific microstructure configurations. In particular, over half of the slip bands emanate from triple junction lines (3D lines defined by the junction of three crystals). Moreover, the most intense and longest slip bands, which would become critical fatigue crack nucleation sites during cyclic loading, are located close and parallel to particular annealing twin boundaries and are simultaneously connected to triple junction lines. Crystal plasticity finite elements calculations are performed on the experimental microstructure to identify the slip activity that results in the formation of high intensity slip bands (localized plasticity) or zones of high lattice rotation (non-localized plasticity) in these particular microstructure regions. (C) 2021 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页数：15

共 56 条

[1]

Ahrens J., 2005, Visualizat. Handbook, DOI [DOI 10.1016/B978-012387582-2/50038-1, 10.1016/B978-012387582-2/50038-1]

[2] CRYSTAL PLASTICITY [J].

ASARO, RJ .

JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1983, 50 (4B) :921-934

[3] Measurements of plastic localization by heaviside-digital image correlation [J].

Bourdin, F. ;

Stinville, J. C. ;

Echlin, M. P. ;

Callahan, P. G. ;

Lenthe, W. C. ;

Torbet, C. J. ;

Texier, D. ;

Bridier, F. ;

Cormier, J. ;

Villechaise, P. ;

Pollock, T. M. ;

Valle, V. .

ACTA MATERIALIA, 2018, 157 :307-325

[4] ON THE STABILITY OF OROWAN LOOPS AROUND COHERENT SPHERICAL ORDERED PRECIPITATES [J].

BRECHET, Y ;

LOUCHET, F .

ACTA METALLURGICA, 1989, 37 (09) :2469-2473

[5] Tuning Strain Localization in Polycrystalline Nickel-Based Superalloys by Thermomechanical Processing [J].

Charpagne, M. A. ;

Stinville, J. C. ;

Polonsky, A. T. ;

Echlin, M. P. ;

Murray, S. P. ;

Chen, Z. ;

Bozzolo, N. ;

Cormier, J. ;

Valle, V. ;

Pollock, T. M. .

SUPERALLOYS 2020, 2020, :471-481

[6] Automated and quantitative analysis of plastic strain localization via multi-modal data recombination [J].

Charpagne, M. A. ;

Stinville, J. C. ;

Callahan, P. G. ;

Texier, D. ;

Chen, Z. ;

Villechaise, P. ;

Valle, V. ;

Pollock, T. M. .

MATERIALS CHARACTERIZATION, 2020, 163

[7] Accurate reconstruction of EBSD datasets by a multimodal data approach using an evolutionary algorithm [J].

Charpagne, Marie-Agathe ;

Strub, Florian ;

Pollock, Tresa M. .

MATERIALS CHARACTERIZATION, 2019, 150 :184-198

[8] A Dictionary Approach to Electron Backscatter Diffraction Indexing [J].

Chen, Yu H. ;

Park, Se Un ;

Wei, Dennis ;

Newstadt, Greg ;

Jackson, Michael A. ;

Simmons, Jeff P. ;

De Graef, Marc ;

Hero, Alfred O. .

MICROSCOPY AND MICROANALYSIS, 2015, 21 (03) :739-752

[9] Strain mapping near a triple junction in strained Ni-based alloy using EBSD and biaxial nanogauges [J].

Clair, A. ;

Foucault, M. ;

Calonne, O. ;

Lacroute, Y. ;

Markey, L. ;

Salazar, M. ;

Vignal, V. ;

Finot, E. .

ACTA MATERIALIA, 2011, 59 (08) :3116-3123

[10] Serial sectioning in the SEM for three dimensional materials science [J].

Echlin, McLean P. ;

Burnett, Timothy L. ;

Polonsky, Andrew T. ;

Pollock, Tresa M. ;

Withers, Philip J. .

CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 2020, 24 (02)

← 1 2 3 4 5 6 →