Manganese silicide single crystal and films deposited on Si(111): A comparative spectroscopic study

被引:14
作者
Carleschi, E. [1 ]
Magnano, E.
Zangrando, M.
Bondino, F.
Nicolaou, A.
Carbone, F.
Van der Marel, D.
Parmigiani, F.
机构
[1] Univ Trieste, Dept Fis, Trieste, Italy
[2] TASC INFM, CNR Lab Natl, I-34012 Trieste, Italy
[3] Univ Paris 11, Lab Phys Solide, Orsay, France
[4] Univ Geneva, Dept Phys Mat Condense, Geneva, Switzerland
关键词
MnSi; thin films; growth; photoemission; X-ray absorption; hybridisation; electron delocalisation; contamination effects;
D O I
10.1016/j.susc.2007.04.178
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A comparative experimental study is presented of the electronic properties of MnSi films grown on Si(111) and of MnSi single crystals, using X-ray absorption spectroscopy (XAS), and core level and valence band photoemission spectroscopy (PES). No significant differences in the electronic structure of the two systems can be found. Absorption measurements on the Mn 2p threshold show a mixed valence ground state, where the multiplet structure is washed out by the hybridisation of the Mn 3d states with the Si sp states. These results are also confirmed by photoemission (PE) spectra from the valence band and the Mn 3s, 3p and 2p core levels. Strong attention has been paid to the effect of contamination. The occurrence of multiplet effects in the absorption spectra indicates unambiguously the localisation of the Mn 3d electrons in Mn-O bonds, which strongly influences the electronic properties of these systems. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:4066 / 4073
页数:8
相关论文
共 29 条
[1]   Ultraviolet photoemission spectroscopy study of ultrahigh-vacuum-fractured CaVO3 surface [J].
Aiura, Y ;
Kawanaka, H ;
Bando, H ;
Yasue, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2001, 19 (04) :1929-1932
[2]   ELECTRONIC-STRUCTURE OF 3D-TRANSITION-METAL COMPOUNDS BY ANALYSIS OF THE 2P CORE-LEVEL PHOTOEMISSION SPECTRA [J].
BOCQUET, AE ;
MIZOKAWA, T ;
SAITOH, T ;
NAMATAME, H ;
FUJIMORI, A .
PHYSICAL REVIEW B, 1992, 46 (07) :3771-3784
[3]   Electronic structure of MnSi: The role of electron-electron interactions [J].
Carbone, F ;
Zangrando, M ;
Brinkman, A ;
Nicolaou, A ;
Bondino, F ;
Magnano, E ;
Nugroho, AA ;
Parmigiani, F ;
Jarlborg, T ;
van der Marel, D .
PHYSICAL REVIEW B, 2006, 73 (08)
[4]   Growth of thin mn films on Si(111)-7x7 and Si(111)-√3x√3:Bi -: art. no. 035431 [J].
Ctistis, G ;
Deffke, U ;
Schwinge, K ;
Paggel, JJ ;
Fumagalli, P .
PHYSICAL REVIEW B, 2005, 71 (03)
[5]   MULTIPLET SPLITTING OF CORE-ELECTRON BINDING ENERGIES IN TRANSITION-METAL IONS [J].
FADLEY, CS ;
SHIRLEY, DA ;
FREEMAN, AJ ;
BAGUS, PS ;
MALLOW, JV .
PHYSICAL REVIEW LETTERS, 1969, 23 (24) :1397-&
[6]   FINAL-STATE SCREENING EFFECT IN THE 3S PHOTOEMISSION SPECTRA OF MN AND FE INSULATING COMPOUNDS [J].
GWEON, GH ;
PARK, JG ;
OH, SJ .
PHYSICAL REVIEW B, 1993, 48 (11) :7825-7835
[7]  
HEIMSMEIER B, 1988, PHYS REV LETT, V61, P2592
[8]   SPIN POLARIZATION OF THE METALLIC FE 3S PHOTOEMISSION SPECTRUM [J].
HILLEBRECHT, FU ;
JUNGBLUT, R ;
KISKER, E .
PHYSICAL REVIEW LETTERS, 1990, 65 (19) :2450-2453
[9]   HELICAL SPIN STRUCTURE IN MANGANESE SILICIDE MNSI [J].
ISHIKAWA, Y ;
TAJIMA, K ;
BLOCH, D ;
ROTH, M .
SOLID STATE COMMUNICATIONS, 1976, 19 (06) :525-528
[10]   MULTIPLET SPLITTING OF MANGANESE 2P AND 3P LEVELS IN MNF2 SINGLE-CRYSTALS [J].
KOWALCZYK, SP ;
LEY, L ;
MCFEELY, FR ;
SHIRLEY, DA .
PHYSICAL REVIEW B, 1975, 11 (04) :1721-1727