Thermal Stability and Hardness Studies of Ge Doped Se-Te Glassy Alloys

被引：1
|
作者：
Rao, Vandita [1 ]
Singh, Pravin Kumar [1 ]
Lohia, Pooja [2 ]
Dwivedi, D. K. [1 ]
机构：
[1] MMM Univ Technol, Dept Appl Sci, Amorphous Semicond Res Lab, Gorakhpur 273010, Uttar Pradesh, India
[2] MMM Univ Technol, Dept Elect & Commun Engn, Gorakhpur 273010, Uttar Pradesh, India
来源：
GLASS PHYSICS AND CHEMISTRY | 2019年 / 45卷 / 06期
关键词：
chalcogenide glass; XRD; DSC; thermal stability; vicker hardness number; CHALCOGENIDE GLASSES; FORMING TENDENCY; NUCLEATION; PARAMETERS;
D O I：
10.1134/S1087659619060178
中图分类号：
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
The amorphous glassy alloys Se82 - xTe18Gex (x = 0, 4, 8, 12, at %) was synthesized using melt quench technique. Thermal stability was examined with the help of various parameters such as Dietzal parameter, Hruby parameter, Saad and Poulin and Lu and Liu parameters. Vicker hardness was obtained from Vicker hardness tester and other related thermo-mechanical properties such as volume of micro-voids, energy formation of micro-voids and modulus of elasticity were calculated.
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页码：459 / 466
页数：8
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