Nanoindentation and FEM study of the effect of internal stress on micro/nano mechanical property of thin CNx films

被引:59
作者
Bai, MW [1 ]
Kato, K
Umehara, N
Miyake, Y
机构
[1] Tohoku Univ, Dept Engn Mech, Sendai, Miyagi 9808579, Japan
[2] Hitachi Ltd, Data Storage & Retrieval Syst Div, Odawara, Kanagawa 2568510, Japan
基金
日本学术振兴会;
关键词
hardness; surface stress; annealing; elastic properties;
D O I
10.1016/S0040-6090(00)01314-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Pursuit of ever-increasing storage density has lead to a steady reduction in head-disk separation which requires protective coating as thin and as hard as possible. It has been found that the internal stress affects micro-tribological properties of CNx film. In this study, thin hard CNx overcoats with different internal stress were synthesized by an ion beam assisted deposition method. Nanoindentation was used to evaluate the micro/nano mechanical properties of CNx film. The resultant load-displacement data was analyzed and it was found that the internal stress does affect the elastic modulus and hardness of CNx film according to the magnitude and type of internal stress. A finite element method was used to simulate the nanoindentation process and to examine the dependence of hardness and modulus on internal stress. Experimental results were compared with calculated results. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:138 / 147
页数:10
相关论文
共 38 条
  • [1] SPATIALLY RESOLVED RAMAN STUDIES OF DIAMOND FILMS GROWN BY CHEMICAL VAPOR-DEPOSITION
    AGER, JW
    VEIRS, DK
    ROSENBLATT, GM
    [J]. PHYSICAL REVIEW B, 1991, 43 (08): : 6491 - 6499
  • [2] Nanoindentation and FEM study of the effect of internal stress on micro/nano mechanical property of thin CNx films
    Bai, MW
    Kato, K
    Umehara, N
    Miyake, Y
    [J]. THIN SOLID FILMS, 2000, 377 : 138 - 147
  • [3] RAMAN AND PHOTOLUMINESCENCE ANALYSIS OF STRESS STATE AND IMPURITY DISTRIBUTION IN DIAMOND THIN-FILMS
    BERGMAN, L
    NEMANICH, RJ
    [J]. JOURNAL OF APPLIED PHYSICS, 1995, 78 (11) : 6709 - 6719
  • [4] Deconvolution of hardness from data obtained from nanoindentation of rough surfaces
    Bobji, MS
    Biswas, SK
    [J]. JOURNAL OF MATERIALS RESEARCH, 1999, 14 (06) : 2259 - 2268
  • [5] BORER A, 1989, MAT RES S P, V130, P231
  • [6] TWO-DIMENSIONAL X-RAY-SCATTERING
    BRENNAN, S
    [J]. SURFACE SCIENCE, 1985, 152 (APR) : 1 - 9
  • [7] INTERNAL STRESSES
    BUCKEL, W
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1969, 6 (04): : 606 - +
  • [8] COMBADIERE L, 1996, SURF COAT TECH, V88, P2837
  • [9] PHOTOLUMINESCENCE STUDIES OF SINTERED DIAMOND COMPACTS
    EVANS, T
    DAVEY, ST
    ROBERTSON, SH
    [J]. JOURNAL OF MATERIALS SCIENCE, 1984, 19 (07) : 2405 - 2414
  • [10] Texture and stress profile in thick polysilicon films suitable for fabrication of microstructures
    Furtsch, M
    Offenberg, M
    Vila, A
    Cornet, A
    Morante, JR
    [J]. THIN SOLID FILMS, 1997, 296 (1-2) : 177 - 180