Dose Rate and Static/Dynamic Bias Effects on CCDs Degradation

被引：10

作者：

Martin, Emma ^{[1
,2
]}

Nuns, Thierry ^{[2
]}

David, Jean-Pierre ^{[2
]}

Gilard, Olivier ^{[1
]}

Boutillier, Mathieu ^{[1
]}

Penquer, Antoine ^{[1
]}

机构：

[1] CNES, F-31401 Toulouse, France

[2] Off Natl Etud & Rech Aerosp, F-31055 Toulouse, France

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2011年 / 58卷 / 03期

关键词：

CCD; dark current; displacement damage dose; TID; CHARGE-COUPLED-DEVICES; DARK CURRENT; MOS DEVICES; DAMAGE; RADIATION; SILICON;

D O I：

10.1109/TNS.2011.2132739

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Dark current evolution in Charge Coupled Devices (CCD) is experimentally studied with Co-60 and proton irradiations. Linear CCDs are irradiated in various static and dynamic bias conditions. Annealing effects are discussed and on-ground data are compared to in-flight data. Presented results on ionization-induced dark current increase in CCDs have demonstrated the impact of the sensor operational conditions and dose rate, revealing an ELDRS-like effect.

引用

页码：891 / 898

页数：8

共 32 条

[1] DOSE-RATE EFFECTS ON TOTAL DOSE DAMAGE [J].

AZAREWICZ, JL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1986, 33 (06) :1420-1424

[2]

BEUTIER T, 2009, P RAD EFF COMP SYST

[3] DISPLACEMENT DAMAGE EFFECTS IN MIXED PARTICLE ENVIRONMENTS FOR SHIELDED SPACECRAFT CCDS [J].

DALE, C ;

MARSHALL, P ;

CUMMINGS, B ;

SHAMEY, L ;

HOLLAND, A .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1993, 40 (06) :1628-1637

[4] PREDICTING SWITCHED-BIAS RESPONSE FROM STEADY-STATE IRRADIATIONS [J].

FLEETWOOD, DM ;

WINOKUR, PS ;

RIEWE, LC .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1990, 37 (06) :1806-1817

[5]

Gaujour MN, 1997, ESA SP PUBL, V395, P331

[6]

GILARD O, 2009, P INT S REL OPT SPAC

[7] Analysis of Total Dose-Induced Dark Current in CMOS Image Sensors From Interface State and Trapped Charge Density Measurements [J].

Goiffon, V. ;

Virmontois, C. ;

Magnan, P. ;

Girard, S. ;

Paillet, P. .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2010, 57 (06) :3087-3094

[8] The effects of Co60 gamma radiation on electron multiplying charge-coupled devices [J].

Hadwen, BJ ;

Camas, MA ;

Robbins, MS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (05) :2747-2752

[9] Total dose testing of a CMOS charged particle spectrometer [J].

Hancock, BR ;

Soli, GA .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1997, 44 (06) :1957-1964

[10]

HERVE D, 1991, P 1 EUR C RAD EFF CO

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